Microscopy Ontology (MO)
type: Ontology
version IRI: https://w3id.org/pmd/mo/1.1
imports: co
creator: https://orcid.org/0000-0002-3717-7104
creator: https://orcid.org/0000-0002-7094-5371
license: http://creativecommons.org/licenses/by/4.0
bibliographic citation: Markus Schilling, June Lau, Bernd Bayerlein. (July 22th, 2024) MO: microscopy ontology. Version 1.1, https://w3id.org/pmd/mo/
version info: 1.1
definition: Die Mikroskopie-Ontologie (MO) baut auf der PMD Core Ontology (PMDco) auf und bietet Konzepte für die semantische (Meta-)Datendarstellung im Bereich der Mikroskopie und Mikroanalyse. Mithilfe eines NLP-Ansatzes wird aus einem großen Korpus von Abstracts aus zwei Jahrzehnten Mikroskopie- und Mikroanalyse-Konferenzbeiträgen die zugrunde liegende Sprache der Community halbautomatisch abgeleitet und in die MO integriert. Die MO ermöglicht die semantische Integration und Verknüpfung von heterogenen Mikroskopie- und Mikroanalysedaten. @de
definition: The Microscopy Ontology (MO) is built on the PMD Core Ontology (PMDco) and provides concepts for semantic (meta)data representation within the domains of microscopy and microanalysis. Using an NLP approach on a large corpus of abstracts from 2 decades of Microscopy and Microanalysis Conference Proceedings, the underlying language of the community is semiautomatically derived and incorporated in the MO. The MO enables semantic integration and linkage of heterogeneous microscopy and microanalysis data.

Aberration
type: Class
subclass of: ValueObject
definition: Abweichung vom idealen oder erwarteten Verhalten, häufig im Zusammenhang mit optischen Systemen verwendet. @de
definition: Deviation from the ideal or expected behavior, often used in the context of optical systems.
definition source: ChatGPT 3.5

Acceleration Voltage
type: Class
subclass of: Voltage
comment: Die Beschleunigungsspannung bestimmt die kinetische Energie der Elektronen und beeinflusst die Auflösung und die Eindringtiefe in die Probe. @de
comment: The acceleration voltage determines the kinetic energy of the electrons and affects the resolution and depth of penetration in the sample.
label: Beschleunigungsspannung @de
definition: Diese Klasse beschreibt die Spannung, die an ein Elektronenmikroskop angelegt wird, um die von der Elektronenquelle (in der Regel eine Kathode) emittierten Elektronen auf die Probe zu beschleunigen. @de
definition: This class decribes the voltage applied to an electron microscope to accelerate the electrons emitted from the electron source (usually a cathode) towards the specimen.
definition source: ChatGPT 3.5

Acquisition Date
type: Class
subclass of: Date
label: Erfassungsdatum @de
definition: The date when the image or data was acquired.
definition source: ChatGPT 3.5

Acquisition Time
type: Class
subclass of: Time
label: Erfassungszeit @de
definition: The time when the image or data was acquired.
definition source: ChatGPT 3.5

Actual Magnification
type: Class
subclass of: Magnification
label: Tatsächliche Vergrößerung @de
definition: Actual Magnification refers to the true magnification level achieved in an electron microscope, which may differ from the indicated magnification.
definition: Tatsächliche Vergrößerung bezieht sich auf den tatsächlichen Vergrößerungsgrad, der in einem Elektronenmikroskop erreicht wird und sich von der angegebenen Vergrößerung unterscheiden kann. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Age
type: Class
subclass of: Duration
label: Alter @de
definition: Die Dauer, die ein Objekt oder Organismus existiert hat. @de
definition: The duration that an object or organism has existed.
definition source: ChatGPT 3.5

Angle
type: Class
subclass of: ValueObject
label: mo
label: Winkel @de
definition: In der Geometrie und Trigonometrie ist ein Winkel ein Maß für eine Drehung, das erforderlich ist, um eine Linie oder Ebene mit einer anderen zur Deckung zu bringen. Ein Winkel wird durch zwei Strahlen gebildet, die einen gemeinsamen Endpunkt haben, der als Scheitelpunkt des Winkels bezeichnet wird. Die Strahlen werden als die Seiten des Winkels bezeichnet. Hinweis: Das Konzept des Winkels ist in der Geometrie von grundlegender Bedeutung und wird häufig verwendet, um die relative Ausrichtung von Linien, Ebenen oder Flächen zu beschreiben. Winkel werden in der Regel in Grad (°) oder Bogenmaß (rad) gemessen. @de
definition: In geometry and trigonometry, an angle is a measure of the amount of rotation needed to bring one line or plane into coincidence with another. An angle is formed by two rays that share a common endpoint, known as the vertex of the angle. The rays are referred to as the sides of the angle. Note: The concept of an angle is fundamental in geometry and is often used to describe the relative orientation of lines, planes, or surfaces. Angles are typically measured in degrees (°) or radians (rad).
definition source: ChatGPT 3.5

Annular Bright Field Scanning Transmission Electron Microscopy
type: Class
subclass of: Scanning Transmission Electron Microscopy
label: Ringförmige Hellfeld-Rastertransmissionselektronenmikroskopie @de
definition: ABF STEM is a technique that utilizes a specific arrangement of detectors to enhance contrast in STEM images, particularly for heavy elements.
definition source: ChatGPT 3.5
abbreviation: ABF-STEM

Annular Dark Field Scanning Transmission Electron Microscopy
type: Class
subclass of: Scanning Transmission Electron Microscopy
label: Ringförmige Dunkelfeld-Rastertransmissionselektronenmikroskopie @de
definition: ADF STEM is a technique that utilizes a specific arrangement of detectors to create contrast in STEM images based on the scattered electrons.
definition source: ChatGPT 3.5
abbreviation: ADF-STEM

Anode
type: Class
subclass of: Electrode
definition: The anode is the positively charged electrode in an electrochemical cell or other electrically driven systems. It serves as the site where oxidation occurs, meaning electrons are released from the anode, typically moving towards the cathode. In devices like batteries, the anode is where electrons are produced during the discharge process.
definition source: ChatGPT 3.5

Aperture
type: Class
subclass of: Component
label: Aperturblende @de
alternative label: Pinhole
definition: An opening through which light or other radiation enters a camera or other optical instrument.
definition: Eine Öffnung, durch die Licht oder andere Strahlung in eine Kamera oder ein anderes optisches Instrument eintritt. @de
definition source: ChatGPT 3.5

Aperture Size
type: Class
subclass of: ValueObject
label: Blendengröße @de
definition: Die Größe der Öffnung in einer Blende, die die Menge des durchgehenden Lichts oder der Strahlung beeinflusst. @de
definition: The size of the opening in an aperture, affecting the amount of light or radiation passing through.
definition source: ChatGPT 3.5

Atmospheric Scanning Electron Microscopy
type: Class
subclass of: Scanning Electron Microscopy
label: Atmosphärische Rasterelektronenmikroskopie @de
definition: Atmospheric Scanning Electron Microscopy is a technique that allows samples to be imaged in their natural, hydrated state at atmospheric pressure. It enables the observation of biological and other hydrated specimens without the need for dehydration or coating.
definition source: ChatGPT 3.5
abbreviation: ASEM

Atomic Resolution
type: Class
subclass of: Resolution
label: Atomare Auflösung @de
definition: Die Fähigkeit, einzelne Atome in einem Bild oder einer Struktur aufzulösen. @de
definition: The ability to resolve individual atoms in an image or structure.
definition source: ChatGPT 3.5

Auger Electron Spectroscopy
type: Class
subclass of: Spectroscopy
label: Auger-Elektronen-Spektroskopie @de
definition: Auger Electron Spectroscopy (AES) is a surface analysis technique used in the field of materials science and surface chemistry. It involves the study of the interactions between high-energy electrons and atoms on the surface of a material. The process is named after Pierre Auger, who made significant contributions to the understanding of this phenomenon. In AES, a sample's surface is bombarded with a beam of high-energy electrons, which causes inner-shell electrons to be ejected from the atoms in the sample. These vacancies are then filled by higher-energy electrons from outer shells, leading to the emission of Auger electrons. The energy of these emitted Auger electrons is characteristic of the specific elements present in the sample and their chemical states. By analyzing the energy spectrum of the emitted Auger electrons, researchers can identify the elements present on the surface of the material and determine their relative concentrations. Auger Electron Spectroscopy provides valuable information about the elemental composition and chemical bonding of the top few atomic layers of a material, making it a powerful tool for studying surface properties, thin films, and interfaces in various scientific and industrial applications.
definition source: ChatGPT 3.5
abbreviation: AES

Beam
type: Class
subclass of: Object
label: Strahl @de
definition: A stream of electrons emitted from the electron source and directed towards the specimen in an electron microscope.
definition: Ein Strom von Elektronen, der von der Elektronenquelle emittiert und auf die Probe in einem Elektronenmikroskop gerichtet wird. @de
definition source: ChatGPT 3.5

Beam Current
type: Class
subclass of: Current
label: Strahlstrom @de
definition: Die Intensität des Elektronenstrahls, gemessen als Anzahl der Elektronen, die eine bestimmte Fläche pro Zeiteinheit durchdringen. @de
definition: The intensity of the electron beam, measured as the number of electrons passing through a given area per unit time.
definition source: ChatGPT 3.5

Beam Energy
type: Class
subclass of: Energy
label: Strahlungsenergie @de
definition: Die Energie eines Teilchen- oder Photonenstrahls, der in verschiedenen Analyseverfahren verwendet wird. @de
definition: The energy of a particle or photon beam used in various analytical techniques.
definition source: ChatGPT 3.5

Beam Offset X
type: Class
subclass of: ValueObject
label: Strahlversatz X @de
definition: Der Versatz des Elektronenstrahls entlang der X-Achse in der Elektronenmikroskopie. @de
definition: The offset of the electron beam along the X-axis in electron microscopy.
definition source: ChatGPT 3.5

Beam Offset Y
type: Class
subclass of: ValueObject
label: Strahlversatz Y @de
definition: Der Versatz des Elektronenstrahls entlang der Y-Achse in der Elektronenmikroskopie. @de
definition: The offset of the electron beam along the Y-axis in electron microscopy.
definition source: ChatGPT 3.5

Beam Path
type: Class
subclass of: Object
label: Strahlengang @de
alternative label: Strahlenweg @de
definition: Die Flugbahn des Elektronenstrahls auf seinem Weg durch das Elektronenmikroskop von der Elektronenquelle zur Probe und dann zum Detektor. @de
definition: The trajectory followed by the electron beam as it travels through the electron microscope, from the electron source to the specimen and then to the detector.
definition source: ChatGPT 3.5

Beam Shift X
type: Class
subclass of: ValueObject
label: Strahlverschiebung X @de
definition: Die Verschiebung des Elektronenstrahls entlang der X-Achse in der Elektronenmikroskopie. @de
definition: The shift of the electron beam along the X-axis in electron microscopy.
definition source: ChatGPT 3.5

Beam Shift Y
type: Class
subclass of: ValueObject
label: Strahlverschiebung Y @de
definition: Die Verschiebung des Elektronenstrahls entlang der Y-Achse in der Elektronenmikroskopie. @de
definition: The shift of the electron beam along the Y-axis in electron microscopy.
definition source: ChatGPT 3.5

Beam Tilt X
type: Class
subclass of: ValueObject
label: Strahlneigung X-Richtung @de
label: Strahlneigung X @de
definition: Beam Tilt X refers to the tilting of the electron beam in the X-axis direction within an electron microscope.
definition: Strahlneigung X bezieht sich auf die Neigung des Elektronenstrahls in Richtung der X-Achse innerhalb eines Elektronenmikroskops. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Beam Tilt Y
type: Class
subclass of: ValueObject
label: Strahlneigung Y-Richtung @de
label: Strahlneigung Y @de
definition: Beam Tilt Y refers to the tilting of the electron beam in the Y-axis direction within an electron microscope.
definition: Strahlneigung Y bezieht sich auf die Neigung des Elektronenstrahls in Richtung der Y-Achse innerhalb eines Elektronenmikroskops. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Bias
type: Class
subclass of: ValueObject
label: Vorspannung @de
definition: A voltage or other value that influences the operation of an electronic component.
definition: Eine Spannung oder ein anderer Wert, der den Betrieb eines elektronischen Bauteils beeinflusst. @de
definition source: ChatGPT 3.5

Bright Field Transmission Electron Microscopy
type: Class
subclass of: TransmissionElectronMicroscopy
label: Hellfeld-Transmissionselektronenmikroskopie @de
definition: Bright Field TEM is an imaging mode in transmission electron microscopy where regions of the sample that scatter electrons less appear brighter in the resulting image.
definition source: ChatGPT 3.5
abbreviation: BFTEM

Brightness
type: Class
subclass of: ValueObject
label: Helligkeit @de
definition: Der Grad der Lichtintensität in einem Bild. @de
definition: The level of light intensity in an image.
definition source: ChatGPT 3.5

CEOS-CEFID Filter
type: Class
subclass of: Energy Filter
subclass of: Image Filter
IAO_0000117: PMDco Team
IAO_0000119: ChatGPT 3.5
definition: A CEOS-CEFID Filter is a specialized energy filter used in electron microscopes for enhancing image contrast and resolution.
definition: Ein CEOS-CEFID Filter ist ein spezialisierter Energiefilter, der in Elektronenmikroskopen verwendet wird, um den Bildkontrast und die Auflösung zu verbessern. @de

Camera Length
type: Class
subclass of: Length
definition: Der Abstand zwischen der Probe und der Kamera, die zur Aufnahme von Bildern in einem Elektronenmikroskop verwendet wird. @de
definition: The distance between the specimen and the camera used to capture images in an electron microscope.
example: STEM camera length
definition source: Camera Length
definition source: Kameralänge @de
definition source: ChatGPT 3.5

Cathode
type: Class
subclass of: Electrode
label: Kathode @de
definition: The cathode is the negatively charged electrode in an electrochemical cell or other electrical systems. It is the site where reduction occurs, leading to the acceptance of electrons from the external circuit. In batteries, for instance, the cathode is where electrons are consumed during the discharge process.
definition source: ChatGPT 3.5

Chamber
type: Class
subclass of: Object
label: Kammer @de
definition: Chamber refers to the enclosed space within an electron microscope where the sample is placed and vacuum conditions are maintained.
definition: Kammer bezieht sich auf den abgeschlossenen Raum in einem Elektronenmikroskop, in dem die Probe platziert wird und Vakuumbedingungen aufrechterhalten werden. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Chamber Vacuum
type: Class
subclass of: Vacuum
label: Kammervakuum @de
definition: Das Vakuumniveau im Inneren der Kammer eines Elektronenmikroskops oder eines anderen Geräts. @de
definition: The vacuum level inside the chamber of an electron microscope or other device.
definition source: ChatGPT 3.5

Channel
type: Class
subclass of: Object
label: Kanal @de
definition: A path along which signals such as data or electrical impulses are transmitted.
definition: Ein Pfad, entlang dem Signale wie Daten oder elektrische Impulse übertragen werden. @de
definition source: ChatGPT 3.5

Chromatic Aberration
type: Class
subclass of: Aberration
label: Chromatische Aberration @de
definition: Die Unfähigkeit eines Objektivs, alle Farben auf denselben Konvergenzpunkt zu fokussieren. @de
definition: The failure of a lens to focus all colors to the same convergence point.
definition source: ChatGPT 3.5

Coherent Beam
type: Class
subclass of: Beam
label: Kohärenter Strahl @de
definition: An electron beam in which the individual electrons maintain a constant phase relationship with each other, resulting in interference patterns when interacting with a sample.
definition: Ein Elektronenstrahl, bei dem die einzelnen Elektronen eine konstante Phasenbeziehung zueinander haben, was bei der Wechselwirkung mit einer Probe zu Interferenzmustern führt. @de
definition source: ChatGPT 3.5

Collection Efficiency
type: Class
subclass of: Efficiency
label: Kollektoreffizienz @de
definition: Die Fähigkeit eines Detektors oder Systems, relevante Signale oder Daten zu erfassen und aufzuzeichnen. @de
definition: The ability of a detector or system to capture and record relevant signals or data.
definition source: ChatGPT 3.5

Collector
type: Class
subclass of: ProcessingNode
label: Kollektor @de
definition: A device that collects charged particles or radiation in a microscope or other instrument.
definition: Ein Gerät, das geladene Teilchen oder Strahlung in einem Mikroskop oder einem anderen Instrument sammelt. @de
definition source: ChatGPT 3.5

Condensor Aperture
type: Class
subclass of: Aperture
label: Kondensorblende @de
definition: An aperture that controls the amount of light entering the condenser lens system in a microscope.
definition: Eine Blende, die die Lichtmenge steuert, die in das Kondensorlinsensystem eines Mikroskops eintritt. @de
definition source: ChatGPT 3.5

Condensor Lens
type: Class
subclass of: Lens
label: Kondensorlinse @de
definition: A condenser lens is an optical element used in microscopy and other optical systems to focus and control the illumination on the sample being observed. It is positioned below the light source and directs light rays onto the specimen, making the illumination uniform and optimizing the quality of the sample's image. The condenser lens helps enhance contrast, resolution, and overall image quality by ensuring that a consistent and concentrated light beam illuminates the specimen.
definition source: ChatGPT 3.5

Confocal Laser Scanning Microscopy
type: Class
subclass of: Light Microscopy
label: Konfokale Laser-Scanning-Mikroskopie @de
definition: Confocal Laser Scanning Microscopy (CLSM) is an optical imaging technique that enhances resolution and eliminates out-of-focus blur by using a spatial pinhole and laser illumination. A focused laser beam is scanned across the sample's surface or depth, and only the light emitted from the focal plane (or a defined section) passes through the pinhole to form an image. CLSM provides high-resolution three-dimensional images, making it popular for biological imaging and studying fluorescently labeled samples.
definition source: ChatGPT 3.5
abbreviation: CLSM

Contrast
type: Class
subclass of: ValueObject
label: Kontrast @de
definition: Der Unterschied in der Leuchtdichte oder Farbe, der Objekte in einem Bild unterscheidbar macht. @de
definition: The difference in luminance or color that makes objects distinguishable in an image.
definition source: ChatGPT 3.5

Convergence Angle
type: Class
subclass of: Angle
comment: Der Konvergenzwinkel beeinflusst die Schärfentiefe und die Auflösung des Bildes. @de
comment: The convergence angle affects the depth of field and resolution of the image.
label: Konvergenzwinkel @de
definition: Der Winkel, in dem der Elektronenstrahl in einem Elektronenmikroskop auf die Probe trifft. @de
definition: The angle at which the electron beam converges onto the specimen in an electron microscope.
definition source: ChatGPT 3.5

Convergent Beam Electron Diffraction
type: Class
subclass of: Electron Diffraction
IAO_0000117: PMDco Team
IAO_0000119: ChatGPT 3.5
label: Konvergente Strahl-Elektronenbeugung @de
definition: Convergent Beam Electron Diffraction is a technique in electron microscopy where a convergent electron beam is used to form diffraction patterns, allowing for precise analysis of crystal structures.
definition: Konvergente Strahl-Elektronenbeugung ist eine Technik in der Elektronenmikroskopie, bei der ein konvergenter Elektronenstrahl verwendet wird, um Beugungsmuster zu erzeugen, die eine präzise Analyse von Kristallstrukturen ermöglichen. @de

Cryo Scanning Electron Microscope
type: Class
subclass of: Scanning Electron Microscope
comment: A cryo-scanning electron microscope is typically used for imaging biological samples.
comment: Ein Kryo-Rasterelektronenmikroskop wird in der Regel zur Abbildung biologischer Proben verwendet. @de
comment: Eine Art Elektronenmikroskop, das bei kryogenen Temperaturen arbeitet. @de
label: Kryo-Rasterelektronenmikroskop @de
label: cryo-SEM
definition: A type of electron microscope that operates under cryogenic temperatures.
definition source: ChatGPT 3.5

Cryo Electron Tomography
type: Class
subclass of: Electron Tomography
label: Kryo-Elektronentomographie @de
definition: Cryo Electron Tomography is a form of electron tomography that is performed at cryogenic temperatures. It is used to study the three-dimensional structure of frozen-hydrated samples.
definition source: ChatGPT 3.5
abbreviation: cryo-ET

Cryo Transmission Electron Microscope
type: Class
subclass of: Transmission Electron Microscope
label: Kryo-Transmissionselektronenmikroskop @de
definition: A transmission electron microscope that operates at cryogenic temperatures.
definition: Ein Transmissionselektronenmikroskop, das bei kryogenen Temperaturen arbeitet. @de
definition source: ChatGPT 3.5
abbreviation: cryo-TEM

Current
type: Class
subclass of: ValueObject
comment: Der Strom wird normalerweise in Ampere (A) gemessen. @de
comment: The current is typically measured in amperes (A).
label: Strom @de
alternative label: Stromstärke @de
definition: Der Fluss der elektrischen Ladung. @de
definition: The flow of electric charge.
definition source: ChatGPT 3.5

Detector
type: Class
subclass of: ProcessingNode
label: Detektor @de
definition: A device used to detect and measure properties such as light, radiation, or particles.
definition: Ein Gerät zur Erkennung und Messung von Eigenschaften wie Licht, Strahlung oder Teilchen. @de
definition source: ChatGPT 3.5

Detector Quantum Efficiency
type: Class
subclass of: Efficiency
label: Detektor Quantenausbeute @de
definition: Die Effizienz, mit der ein Detektor einfallende Strahlung in Nutzsignale umwandelt. @de
definition: The efficiency with which a detector converts incident radiation into useful signals.
definition source: ChatGPT 3.5

Diffraction
type: Class
subclass of: Physical Process
label: Diffraktion @de
alternative label: Beugung @de
alternative label: Scattering
definition: Die Biegung von Elektronenwellen beim Durchgang durch eine kristalline Probe, was zur Bildung von Beugungsmustern führt, die Informationen über die Kristallstruktur liefern. @de
definition: The bending of electron waves as they pass through a crystalline sample, resulting in the formation of diffraction patterns that provide information about the crystal structure.
definition source: ChatGPT 3.5

Diffraction Pattern
type: Class
subclass of: DigitalEntity
label: Beugungsmuster @de
definition: Das Muster von Flecken oder Banden, das auf einem Detektor entsteht, wenn Elektronen nach der Wechselwirkung mit einer kristallinen Probe gebeugt werden. @de
definition: The pattern of spots or bands produced on a detector when electrons diffract after interacting with a crystalline sample.
definition source: ChatGPT 3.5

Disc Aperture
type: Class
subclass of: Aperture
label: Scheibenblende @de
definition: A circular aperture used to limit the beam size in an optical instrument.
definition: Eine kreisförmige Blende zur Begrenzung der Strahlgröße in einem optischen Instrument. @de
definition source: ChatGPT 3.5

Disk Of Least Confusion
type: Class
subclass of: CrossSectionArea
label: Scheibe der geringsten Konfusion @de
definition: Der Bereich in der Bildebene eines Elektronenmikroskops, in dem der Elektronenstrahl auf die kleinste Punktgröße fokussiert wird, wodurch die durch sphärische Aberration verursachte Unschärfe minimiert wird. @de
definition: The region in the image plane of an electron microscope where the electron beam is focused to the smallest spot size, minimizing the blurring effect due to spherical aberration.
definition source: ChatGPT 3.5

Drift Correction
type: Class
subclass of: AnalysingProcess
label: Driftkorrektur @de
definition: Drift Correction refers to techniques used in electron microscopy to compensate for the slow movement of the sample or beam, ensuring image stability and accuracy.
definition: Driftkorrektur bezieht sich auf Techniken in der Elektronenmikroskopie, die dazu dienen, die langsame Bewegung der Probe oder des Strahls auszugleichen und so Bildstabilität und Genauigkeit zu gewährleisten. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Dwell Time
type: Class
subclass of: Duration
label: Verweilzeit @de
alternative label: Verweildauer @de
definition: Die Zeitspanne, in der der Elektronenstrahl während der Bildgebung oder Analyse auf einen bestimmten Punkt oder einen interessierenden Bereich der Probe fokussiert wird. @de
definition: The amount of time that the electron beam is focused on a specific point or region of interest on the specimen during imaging or analysis.
definition source: ChatGPT 3.5

Dynamic Focus Correction
type: Class
subclass of: AnalysingProcess
label: Dynamische Fokuskorrektur @de
definition: A technique used in electron microscopy to continuously adjust the focus of the electron beam in real-time to maintain optimal image quality, especially when imaging uneven or rough surfaces.
definition: Eine Technik, die in der Elektronenmikroskopie eingesetzt wird, um den Fokus des Elektronenstrahls kontinuierlich in Echtzeit anzupassen und so eine optimale Bildqualität zu erhalten, insbesondere bei der Abbildung unebener oder rauer Oberflächen. @de
definition source: ChatGPT 3.5

Dynamic Refocusing
type: Class
subclass of: AnalysingProcess
label: Dynamische Refokussierung @de
definition: Der Prozess, bei dem der Fokus des Elektronenstrahls während der Bildgebung angepasst wird, um Änderungen der Probenhöhe oder -topografie zu kompensieren und sicherzustellen, dass die gesamte Probe im Fokus bleibt. @de
definition: The process of adjusting the focus of the electron beam during imaging to compensate for changes in the specimen height or topography, ensuring that the entire specimen remains in focus.
definition source: ChatGPT 3.5

Dynamic Transmission Electron Microscopy
type: Class
subclass of: TransmissionElectronMicroscopy
label: Dynamische Transmissionselektronenmikroskopie @de
definition: Dynamic Transmission Electron Microscopy is a technique that uses ultrafast electron pulses to capture rapid processes in materials with nanosecond to picosecond time resolution.
definition source: ChatGPT 3.5
abbreviation: DTEM

Efficiency
type: Class
subclass of: ValueObject
label: Effizienz @de
definition: Das Verhältnis von nützlichem / nutzbarem Output zum gesamten Input in einem System. @de
definition: The ratio of useful output to total input in any system.
definition source: ChatGPT 3.5

Electrode
type: Class
subclass of: ProcessingNode
label: Elektrode @de
definition: An electrode is a conductor through which electric current enters or exits a substance. In the context of electrochemical systems, an electrode facilitates the transfer of electrons between a solid material and an electrolyte. Electrodes are essential components in batteries, fuel cells, electroplating, and other electrochemical processes. They play a critical role in facilitating chemical reactions and energy storage or conversion.
definition source: ChatGPT 3.5

Electron Backscatter Diffraction
type: Class
subclass of: Electron Diffraction
label: Rückstreuelektronenbeugung @de
definition: Electron Backscatter Diffraction is a microscopy technique used to analyze the crystallographic orientation and microstructure of materials. It involves directing an electron beam onto a sample's surface and measuring the backscattered electrons. By analyzing the diffraction patterns of these electrons, researchers can determine the crystallographic orientation of the material's grains.
definition source: ChatGPT 3.5
abbreviation: EBSD

Electron Beam
type: Class
subclass of: Beam
label: Elektronenstrahl @de
definition: A stream of electrons emitted from an electron source and accelerated towards the specimen in an electron microscope for imaging or analysis.
definition: Ein Strom von Elektronen, der von einer Elektronenquelle emittiert und in einem Elektronenmikroskop zur Abbildung oder Analyse auf die Probe beschleunigt wird. @de
definition source: ChatGPT 3.5

Electron Channeling Contrast Imaging
type: Class
subclass of: Scanning Electron Microscopy
label: Elektronenkanal-Kontrastbildgebung @de
definition: Electron Channeling Contrast Imaging is a technique used in SEM or TEM to study crystallographic defects, such as dislocations, in crystalline materials. It utilizes the contrast resulting from the deviation of electron trajectories due to crystal defects.
definition source: ChatGPT 3.5
abbreviation: ECCI

Electron Diffraction
type: Class
subclass of: Diffraction
label: Elektronenbeugung @de
definition: Das Phänomen der Beugung von Elektronenwellen beim Durchgang durch eine kristalline Probe, das Informationen über die Kristallstruktur liefert. @de
definition: The phenomenon of electron waves diffracting as they pass through a crystalline sample, providing information about the crystal structure.
definition source: ChatGPT 3.5

Electron Diffraction Pattern
type: Class
subclass of: Diffraction Pattern
label: Elektronenbeugungsmuster @de
definition: Das Muster von Flecken oder Ringen, das auf einem Detektor entsteht, wenn Elektronen nach der Wechselwirkung mit einer kristallinen Probe gebeugt werden, und das zur Bestimmung der Kristallstruktur verwendet wird. @de
definition: The pattern of spots or rings produced on a detector when electrons diffract after interacting with a crystalline sample, used to determine the crystal structure.
definition source: ChatGPT 3.5

Electron Energy Loss Spectrometer
type: Class
equivalent class: Restriction
  on property: hasFunction
  some values from: Energy Filter
equivalent class: Restriction
  on property: hasFunction
  some values from: Image Filter
equivalent class: Restriction
  on property: relatesTo
  some values from: CEOS-CEFID Filter
equivalent class: Restriction
  on property: relatesTo
  some values from: Gatan Image Filter
subclass of: Spectrometer
IAO_0000117: PMDco Team
IAO_0000119: ChatGPT 3.5
label: Elektronen-Energieverlust-Spektrometer @de
definition: An Electron Energy Loss Spectrometer is a device used to measure the energy loss of electrons as they pass through a sample, providing information on the sample's composition and electronic structure.
definition: Ein Elektronen-Energieverlust-Spektrometer ist ein Gerät, das verwendet wird, um den Energieverlust von Elektronen beim Durchgang durch eine Probe zu messen, was Informationen über die Zusammensetzung und die elektronische Struktur der Probe liefert. @de

Electron Energy Loss Spectroscopy
type: Class
subclass of: Spectroscopy
label: Elektronenenergieverlustspektroskopie @de
definition: Electron Energy Loss Spectroscopy (EELS) is a specialized analytical technique in the field of materials science and electron microscopy. It involves the measurement of the energy loss of electrons as they interact with a sample. EELS is commonly performed in transmission electron microscopy (TEM) setups. In EELS, a focused beam of high-energy electrons is directed at a sample. As these electrons pass through the material, they can lose energy through various interactions, such as inelastic scattering and excitation of inner-shell electrons. The energy loss is measured and analyzed to gain information about the sample's composition, electronic structure, and bonding characteristics. By studying the energy loss spectrum, researchers can identify the types of atoms present in the sample, determine their chemical states, and gather insights into the electronic properties of the material. EELS is particularly useful for investigating nanoscale materials, thin films, and interfaces, providing valuable information about their electronic and atomic structure. It is a powerful technique for understanding the behavior of materials at the nanometer scale and plays a significant role in advancing fields such as materials science, nanotechnology, and semiconductor research.
definition source: ChatGPT 3.5
abbreviation: EELS

Electron Microprobe
type: Class
subclass of: ElectronMicroscope
label: Elektronenmikrosonde @de
definition: An analytical instrument used to determine the chemical composition of materials.
definition: Ein Analyseinstrument zur Bestimmung der chemischen Zusammensetzung von Materialien. @de
definition source: ChatGPT 3.5

Electron Probe
type: Class
subclass of: Beam
label: Elektronensonde @de
definition: Der fokussierte Elektronenstrahl, der zur Abbildung oder Analyse in einem Elektronenmikroskop verwendet wird. @de
definition: The focused electron beam used for imaging or analysis in an electron microscope.
definition source: ChatGPT 3.5

Electron Probe Micro Analyzer
type: Class
subclass of: Electron Microprobe
label: Elektronensonden-Mikro-Analysator @de
definition: An instrument used for elemental analysis of solid materials by bombarding them with a focused electron beam.
definition: Ein Instrument zur Elementaranalyse fester Materialien durch Beschuss mit einem fokussierten Elektronenstrahl. @de
definition source: ChatGPT 3.5

Electron Tomograph
type: Class
subclass of: Transmission Electron Microscope
label: Elektronentomograph @de
definition: An instrument used for tomographic imaging using electrons.
definition: Ein Instrument für die tomografische Bildgebung mit Elektronen. @de
definition source: ChatGPT 3.5
abbreviation: ET

Electron Tomography
type: Class
subclass of: TransmissionElectronMicroscopy
label: Elektronentomographie @de
definition: Electron Tomography is a technique that involves collecting a series of transmission electron microscopy (TEM) images from different angles to reconstruct a three-dimensional image of a sample.
definition source: ChatGPT 3.5
abbreviation: ET

Emission Current
type: Class
subclass of: Current
comment: Der Emissionsstrom wird normalerweise in Mikroampere (μA) oder Milliampere (mA) gemessen. @de
comment: The emission current usually measured in microamperes (μA) or milliamperes (mA).
label: Emissionsstrom @de
definition: Der Strom der von der Elektronenquelle emittierten Elektronen. @de
definition: The current of electrons emitted from the electron source.
definition source: ChatGPT 3.5

Energy
type: Class
subclass of: ValueObject
comment: Die Energie wird üblicherweise in Joule (J) oder Elektronenvolt (eV) gemessen. @de
comment: The energy is usually measured in joules (J) or electron volts (eV).
label: Energie @de
definition: Die Fähigkeit eines physischen Systems, Arbeit zu verrichten. @de
definition: The capacity of a physical system to perform work.
definition source: ChatGPT 3.5

Energy Dispersive X-ray Spectroscopy
type: Class
subclass of: Spectroscopy
subclass of: X-ray Microanalysis
alternative label: energiedispersive Röntgenmikroanalyse @de
definition: Energy Dispersive X-ray Spectroscopy is a technique used to analyze the elemental composition of a sample by detecting the X-rays emitted when the sample is bombarded with electrons in an electron microscope or other instrument. EDS provides information about the elements present in the sample and their relative concentrations.
preferred label: energiedispersive Röntgenanalyse @de
definition source: ChatGPT 3.5
abbreviation: EDS
abbreviation: EDX
abbreviation: XEDS

Energy Filter
type: Class
subclass of: Optical Element
IAO_0000117: PMDco Team
IAO_0000119: ChatGPT 3.5
label: Energie-Filter @de
definition: An Energy Filter is a device used in electron microscopy to filter electrons by their energy, improving image quality and enabling specific analytical techniques.
definition: Ein Energie-Filter ist ein Gerät, das in der Elektronenmikroskopie verwendet wird, um Elektronen nach ihrer Energie zu filtern, die Bildqualität zu verbessern und spezifische Analysetechniken zu ermöglichen. @de

Energy-filtered Transmission Electron Microscope
type: Class
subclass of: Transmission Electron Microscope
label: Energiegefiltertes Transmissionselektronenmikroskop @de
definition: A transmission electron microscope equipped with an energy filter to select electrons of specific energy levels.
definition: Ein Transmissionselektronenmikroskop, das mit einem Energiefilter ausgestattet ist, um Elektronen bestimmter Energieniveaus zu selektieren. @de
definition source: ChatGPT 3.5

Energy Loss
type: Class
subclass of: Energy
label: Energieverlust @de
definition: Der Energieverlust, den ein Teilchen beim Durchgang durch ein Medium erfährt. @de
definition: The loss of energy experienced by a particle as it passes through a medium.
definition source: ChatGPT 3.5

Energy Resolution
type: Class
subclass of: Resolution
label: Energieauflösung @de
definition: Die Fähigkeit eines Detektors, zwischen verschiedenen Energieniveaus der einfallenden Strahlung zu unterscheiden. @de
definition: The ability of a detector to distinguish between different energy levels of incident radiation.
definition source: ChatGPT 3.5

Environmental Scanning Electron Microscope
type: Class
subclass of: Scanning Electron Microscope
label: Umwelt-Rasterelektronenmikroskop @de
definition: A type of electron microscope that can image non-conductive samples in their natural state.
definition: Eine Art Elektronenmikroskop, das nicht leitende Proben in ihrem natürlichen Zustand abbilden kann. @de
definition source: ChatGPT 3.5
abbreviation: ESEM

Environmental Scanning Electron Microscopy
type: Class
subclass of: Scanning Electron Microscopy
label: Umgebungs-Rasterelektronenmikroskopie @de
definition: Environmental Scanning Electron Microscopy is a technique that allows imaging of samples in a gaseous environment. It is particularly useful for observing hydrated or non-conductive samples without the need for extensive sample preparation.
definition source: ChatGPT 3.5
abbreviation: ESEM

Environmental Transmission Electron Microscopy
type: Class
subclass of: TransmissionElectronMicroscopy
label: Umgebungs-Transmissionselektronenmikroskopie @de
definition: Environmental Transmission Electron Microscopy allows imaging and analysis of materials in controlled gaseous environments, simulating real-world conditions.
definition source: ChatGPT 3.5
abbreviation: ETEM

Exposure Time
type: Class
subclass of: Duration
label: Belichtungszeit @de
definition: Die Dauer, während der der Bildsensor dem Licht ausgesetzt ist, gemessen in Sekunden (s). @de
definition: The duration for which the imaging sensor is exposed to light, measured in seconds (s).
definition source: ChatGPT 3.5

Extraction Voltage
type: Class
subclass of: Voltage
label: Extraktionsspannung @de
definition: Die Spannung, die an die Elektronenquelle in einem Elektronenmikroskop angelegt wird, um Elektronen aus der Kathode zu extrahieren und sie auf die Probe zu beschleunigen. @de
definition: The voltage applied to the electron source in an electron microscope to extract electrons from the cathode and accelerate them towards the specimen.
definition source: ChatGPT 3.5

Field Emission Gun
type: Class
subclass of: Gun
label: Feldemissionskanone @de
definition: A Field Emission Gun is an electron gun used in electron microscopes to produce an electron beam with extremely high brightness and coherence. It relies on the phenomenon of field emission, where electrons are emitted from a sharp emitter tip under the influence of a strong electric field. FEGs are capable of producing highly focused electron beams, leading to enhanced imaging resolution and analytical capabilities.
definition source: ChatGPT 3.5
abbreviation: FEG

Field Emission Scanning Electron Microscopy
type: Class
subclass of: Scanning Electron Microscopy
label: Feldemissions-Rasterelektronenmikroskopie @de
definition: Field Emission Scanning Electron Microscopy is an advanced form of SEM that uses a field emitter to produce a highly focused electron beam, enabling high-resolution imaging and surface analysis.
definition source: ChatGPT 3.5
abbreviation: FESEM

Field Ion Microscope
type: Class
subclass of: Ion Microscope
label: Feldionenmikroskop @de
definition: A type of microscope that uses the phenomenon of field ionization to image surfaces with atomic resolution.
definition: Ein Mikroskoptyp, der das Phänomen der Feldionisation nutzt, um Oberflächen mit atomarer Auflösung abzubilden. @de
definition source: ChatGPT 3.5
abbreviation: FIM

Field Ion Microscopy
type: Class
subclass of: Ion Microscopy
label: Feldionenmikroskopie @de
definition: Field Ion Microscopy is a specialized microscopy technique that uses a strong electric field to ionize atoms on the surface of a metal sample. These ionized atoms are then repelled from the surface and can be detected to create an image of the sample's surface topography at atomic resolution. FIM is especially powerful for imaging the arrangement of atoms on metallic surfaces.
definition source: ChatGPT 3.5
abbreviation: FIM

Field Width
type: Class
subclass of: Width
label: Feldbreite @de
definition: Field Width refers to the horizontal extent of the observable field in an electron microscope.
definition: Feldbreite bezieht sich auf den horizontalen Umfang des beobachtbaren Feldes in einem Elektronenmikroskop. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Filament
type: Class
subclass of: Component
definition: A thin wire or thread that emits electrons when heated in a vacuum tube or electron microscope.
definition: Ein dünner Draht oder Faden, der Elektronen emittiert, wenn er in einer Vakuumröhre oder einem Elektronenmikroskop erhitzt wird. @de
definition source: ChatGPT 3.5

Filament Current
type: Class
subclass of: Current
label: Glühfadenstrom @de
definition: Der Strom, der durch den Glühfaden der Elektronenkanone in einem Elektronenmikroskop fließt und den Glühfaden erhitzt, um Elektronen zu emittieren. @de
definition: The current passing through the filament of the electron gun in an electron microscope, which heats up the filament to emit electrons.
definition source: ChatGPT 3.5

Fluorescence Microscopy
type: Class
subclass of: Light Microscopy
label: Fluoreszenzmikroskopie @de
definition: Fluorescence Microscopy is an optical imaging technique used to visualize biological structures and molecules that fluoresce when illuminated with specific wavelengths of light. Fluorescent molecules absorb light energy and then emit light of a longer wavelength, allowing the visualization of specific molecules or cellular components. Fluorescence microscopy is widely used in cell biology, molecular biology, and medical research.
definition source: ChatGPT 3.5

Flyback Time
type: Class
subclass of: Duration
label: Rücklaufzeit @de
definition: Die Zeit, die der Elektronenstrahl benötigt, um nach dem Abtasten einer Zeile oder eines Bildes in einem Elektronenmikroskop in seine Ausgangsposition zurückzukehren. @de
definition: The time taken for the electron beam to return to its starting position after scanning a line or frame in an electron microscope.
definition source: ChatGPT 3.5

Focal Length
type: Class
subclass of: Length
label: Brennweite @de
definition: Der Abstand zwischen dem Brennpunkt (wo der Elektronenstrahl fokussiert wird) und der Linse oder Blende in einem Elektronenmikroskop. @de
definition: The distance between the focal point (where the electron beam is focused) and the lens or aperture in an electron microscope.
definition source: ChatGPT 3.5

Focal Plane
type: Class
subclass of: Area
label: Brennebene @de
definition: Die Ebene senkrecht zur optischen Achse eines Elektronenmikroskops, in der der Elektronenstrahl fokussiert wird, um ein Bild zu erzeugen. @de
definition: The plane perpendicular to the optical axis of an electron microscope where the electron beam is focused to form an image.
definition source: ChatGPT 3.5

Focal Point
type: Class
subclass of: DigitalEntity
label: Brennpunkt @de
definition: Der Punkt, an dem der Elektronenstrahl in einem Elektronenmikroskop fokussiert wird, um ein Bild der Probe zu erzeugen. @de
definition: The point at which the electron beam is focused in an electron microscope to form an image of the specimen.
definition source: ChatGPT 3.5

Focused Beam
type: Class
subclass of: Beam
label: Fokussierter Strahl @de
definition: An electron beam that has been narrowed or focused to a small spot size on the specimen surface.
definition: Ein Elektronenstrahl, der auf einen kleinen Punkt auf der Probenoberfläche eingeengt oder fokussiert wurde. @de
definition source: ChatGPT 3.5

Focus(ed) Ion Beam - Scanning Electron Microscope
type: Class
subclass of: Ion Microscope
label: Fokussierter Ionenstrahl - Rasterelektronenmikroskop @de
definition: A dual-beam microscope that combines a focused ion beam with a scanning electron microscope.
definition: Ein Zweistrahlmikroskop, das einen fokussierten Ionenstrahl mit einem Rasterelektronenmikroskop kombiniert. @de
definition source: ChatGPT 3.5
abbreviation: FIB-SEM

Focused Ion Beam Scanning Electron Microscopy
type: Class
subclass of: Ion Microscopy
label: Fokussierte Ionenstrahl-Rasterelektronenmikroskopie @de
definition: Focused Ion Beam Scanning Electron Microscopy is a combination of two techniques: focused ion beam (FIB) and scanning electron microscopy (SEM). FIB-SEM systems use a focused ion beam to both image and modify a sample's surface. The ion beam can be used for milling, cutting, and deposition processes, making FIB-SEM a versatile tool for materials analysis, sample preparation, and three-dimensional imaging.
definition source: ChatGPT 3.5
abbreviation: FIB-SEM

Fourier Transform Infrared Spectroscopy
type: Class
subclass of: Spectroscopy
label: Fourier-Transformations-Infrarotspektroskopie @de
definition: Fourier Transform Infrared Spectroscopy (FTIR) is a powerful analytical technique used in various scientific disciplines to study the molecular composition and properties of materials. It is based on the interaction between infrared radiation and a sample, providing information about the vibrational modes of molecules. In FTIR spectroscopy, an infrared beam is directed through a sample, and the interaction between the radiation and the sample's molecules leads to absorption of specific infrared frequencies. Each type of molecular bond and functional group in the sample absorbs infrared radiation at characteristic frequencies, which correspond to the energies of molecular vibrations. The resulting absorption spectrum represents a fingerprint of the sample's molecular structure. The Fourier transform technique is used to convert the raw data obtained from the absorption measurements into a Fourier-transformed spectrum. This transformation improves the signal-to-noise ratio and enhances the accuracy of spectral analysis. FTIR is extensively used in a wide range of fields, including chemistry, biology, materials science, pharmaceuticals, and environmental science. It is employed for qualitative and quantitative analysis, identification of compounds, monitoring chemical reactions, and studying molecular interactions. FTIR spectroscopy provides valuable insights into molecular bonding, functional groups, and the chemical composition of substances, making it an indispensable tool in modern analytical science.
definition source: ChatGPT 3.5
abbreviation: FTIR

Frame
type: Class
subclass of: DigitalEntity
label: Bildrahmen @de
definition: A single image or capture in a sequence of images.
definition: Ein einzelnes Bild oder eine Aufnahme in einer Bildsequenz. @de
definition source: ChatGPT 3.5

Frame Count
type: Class
subclass of: ValueObject
label: Bildanzahl @de
definition: Die Gesamtanzahl der Bilder oder Aufnahmen in einer Sequenz. @de
definition: The total number of frames or images in a sequence.
definition source: ChatGPT 3.5

Frame Time
type: Class
subclass of: Duration
label: Rahmenscanzeit @de
definition: Die Zeit, die benötigt wird, um ein Einzelbild in einem Elektronenmikroskop aufzunehmen und anzuzeigen. @de
definition: The time required to capture and display a single frame of an image in an electron microscope.
definition source: ChatGPT 3.5

Gamma
type: Class
subclass of: ValueObject
definition: The nonlinear operation used to encode and decode luminance or color values in an image.
definition source: ChatGPT 3.5

Gatan Image Filter
type: Class
subclass of: Energy Filter
subclass of: Image Filter
label: Gatan Abbildungsfilter @de
definition: A Gatan Image Filter refers to an image filter manufactured by Gatan, Inc., a company specializing in electron microscopy and related products. Gatan's image filters are designed for electron microscopes and electron energy loss spectroscopy (EELS) applications. These filters allow researchers to control and enhance the acquisition of electron energy loss spectra while obtaining high-resolution images of the sample under investigation.
definition source: ChatGPT 3.5

Grid Voltage
type: Class
subclass of: Voltage
label: Gitterspannung @de
definition: Grid Voltage refers to the voltage applied to the control grid in an electron microscope, which influences the electron beam's focus and intensity.
definition: Gitterspannung bezieht sich auf die Spannung, die an das Steuergitter in einem Elektronenmikroskop angelegt wird und die den Fokus und die Intensität des Elektronenstrahls beeinflusst. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Gun
type: Class
equivalent class: Restriction
  on property: component
  some values from: Source
subclass of: ProcessingNode
label: Kanone @de
definition: In the context of electron microscopy and particle acceleration, a "gun" typically refers to an electron or particle source that generates and emits the particles. In electron microscopy, an electron gun is used to generate a beam of electrons for imaging or analysis. In particle accelerators, a particle gun generates and launches particles at high speeds for various experimental purposes.
definition source: ChatGPT 3.5

Gun Vacuum
type: Class
subclass of: Vacuum
label: Kanonen-Vakuum @de
definition: Das Vakuumniveau im Inneren der Elektronenkanone eines Elektronenmikroskops. @de
definition: The vacuum level inside the electron gun of an electron microscope.
definition source: ChatGPT 3.5

Helium Ion Microscope
type: Class
subclass of: Focus(ed) Ion Beam - Scanning Electron Microscope
label: Helium-Ionen-Mikroskop @de
definition: A type of microscope that uses helium ions to image samples with high resolution.
definition: Eine Art Mikroskop, das Helium-Ionen verwendet, um Proben mit hoher Auflösung abzubilden. @de
definition source: ChatGPT 3.5
abbreviation: HIM

Helium Ion Microscopy
type: Class
subclass of: Ion Microscopy
label: Helium-Ionen-Mikroskopie @de
definition: Helium Ion Microscopy is a microscopy technique that uses a beam of helium ions instead of electrons to interact with a sample's surface. The smaller mass of helium ions compared to electrons allows for higher resolution imaging and reduced sample damage. HIM provides high-resolution images and is often used for imaging delicate or sensitive samples.
definition source: ChatGPT 3.5
abbreviation: HIM

High-angle Annular Dark-field Scanning Transmission Electron Microscope
type: Class
subclass of: Scanning Transmission Electron Microscope
label: Hochwinkel-Dunkelfeld-Rastertransmissionselektronenmikroskop mit annularem Winkel @de
definition: A type of scanning transmission electron microscope that detects scattered electrons at high angles.
definition: Eine Art Rastertransmissionselektronenmikroskop, das gestreute Elektronen in hohen Winkeln erkennt. @de
definition source: ChatGPT 3.5
abbreviation: HAADF-STEM

High Resolution Transmission Electron Microscope
type: Class
subclass of: Transmission Electron Microscope
label: Hochauflösendes Transmissionselektronenmikroskop @de
definition: A transmission electron microscope capable of achieving high-resolution images.
definition: Ein Transmissionselektronenmikroskop, das hochauflösende Bilder liefert. @de
definition source: ChatGPT 3.5
abbreviation: HRTEM

High Resolution Transmission Electron Microscopy
type: Class
subclass of: TransmissionElectronMicroscopy
label: Hochauflösende Transmissionselektronenmikroskopie @de
definition: High Resolution TEM is a technique that provides exceptionally high-resolution images of a sample's internal structure, revealing atomic-level details.
definition source: ChatGPT 3.5
abbreviation: HRTEM

Holder
type: Class
subclass of: Component
label: Halter @de
definition: A device used to support or secure a specimen or component in place.
definition: Ein Gerät, das verwendet wird, um eine Probe oder ein Bauteil zu stützen oder zu sichern. @de
definition source: ChatGPT 3.5

Horizontal Field Width
type: Class
subclass of: Field Width
label: Horizontale Feldbreite @de
definition: Horizontal Field Width refers to the horizontal extent of the observable field in an electron microscope.
definition: Horizontale Feldbreite bezieht sich auf den horizontalen Umfang des beobachtbaren Feldes in einem Elektronenmikroskop. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Image Path
type: Class
subclass of: Identifier
label: Bildpfad @de
definition: Der Speicherort oder Verzeichnispfad, an dem eine Bilddatei gespeichert ist. @de
definition: The location or directory path where an image file is stored.
definition source: ChatGPT 3.5

Image Filter
type: Class
subclass of: Optical Element
label: Abbildungsfilter @de
definition: An image filter is a device or component used in imaging systems, such as microscopy or photography, to modify the appearance of an image by selectively altering certain characteristics. Filters can be used to adjust contrast, brightness, color balance, and other image properties. They are often used to enhance specific features or to correct for distortions caused by lighting conditions or optical imperfections.
definition source: ChatGPT 3.5

Image Name
type: Class
subclass of: Identifier
label: Bildname @de
definition: The designated name or title for an image.
definition source: ChatGPT 3.5

Image Size X-Axis
type: Class
subclass of: ValueObject
label: Bildgröße X-Achse @de
definition: The size of the image along the X-axis.
definition source: ChatGPT 3.5

Image Size Y-Axis
type: Class
subclass of: ValueObject
label: Bildgröße Y-Achse @de
definition: The size of the image along the Y-axis.
definition source: ChatGPT 3.5

Incident Beam
type: Class
subclass of: Beam
label: Einfallender Strahl @de
definition: Der Elektronenstrahl, der in einem Elektronenmikroskop auf die Probenoberfläche trifft und Wechselwirkungen hervorruft, die Signale für die Abbildung oder Analyse erzeugen. @de
definition: The electron beam that strikes the specimen surface in an electron microscope, causing interactions that produce signals for imaging or analysis.
definition source: ChatGPT 3.5

Indicated Magnification
type: Class
subclass of: Magnification
label: Angegebene Vergrößerung @de
definition: Indicated Magnification refers to the magnification level shown by the instrument's controls or display in an electron microscope.
definition: Angegebene Vergrößerung bezieht sich auf den Vergrößerungsgrad, der von den Steuerungen oder Anzeigen des Instruments in einem Elektronenmikroskop angezeigt wird. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Inelastic Scattering
type: Class
subclass of: Physical Process
label: Inelastische Streuung @de
definition: Inelastic scattering is a scattering process that involves the transfer of energy and momentum between the incident particle (e.g., photon, electron) and the target particle. During inelastic scattering, the energy of the scattered particle changes, and the interaction may result in various outcomes, such as excitation, emission, or other energy transfers that alter the internal state of the target particle.
definition source: ChatGPT 3.5

Interaction Volume
type: Class
subclass of: Volume
label: Überlagerungsvolumen @de
definition: Der Bereich innerhalb einer Probe, in dem ein Teilchenstrahl mit dem Material in Wechselwirkung tritt. @de
definition: The region within a sample where a particle beam interacts with the material.
definition source: ChatGPT 3.5

Intermediate Lens
type: Class
subclass of: Lens
label: Zwischenlinse @de
definition: A lens that is positioned between the objective lens and the projector lens in an optical system.
definition: Eine Linse, die zwischen der Objektivlinse und der Projektorlinse in einem optischen System positioniert ist. @de
definition source: ChatGPT 3.5

Ion Beam
type: Class
subclass of: Beam
label: Ionenstrahl @de
definition: A stream of ions used for grinding or analysis, especially in ion microscopy techniques for imaging.
definition: Ein Ionenstrom, der zum Mahlen oder zur Analyse verwendet wird, insbesondere bei Ionenmikroskopietechniken zur Bildgebung. @de
definition source: ChatGPT 3.5

Ion Microscope
type: Class
subclass of: Micropscope
label: Ionenmikroskop @de
definition: A microscope that uses ions to create images of samples.
definition: Ein Mikroskop, das mit Hilfe von Ionen Bilder von Proben erzeugt. @de
definition source: ChatGPT 3.5

Ion Microscopy
type: Class
subclass of: MicroscopyProcess
label: Ionenmikroskopie @de
definition: Ion Microscopy refers to a group of microscopy techniques that use focused ion beams to image and analyze samples. These techniques utilize ions, such as protons or heavy ions, instead of electrons or photons to interact with the sample, providing valuable information about its composition and structure.
definition source: ChatGPT 3.5

Lens
type: Class
subclass of: Optical Element
label: Linse @de
definition: A piece of optical glass or other transparent material used to focus or magnify light in optical instruments.
definition: Ein Stück optisches Glas oder anderes transparentes Material, das zum Fokussieren oder Vergrößern von Licht in optischen Geräten verwendet wird. @de
definition source: ChatGPT 3.5

Light Microscope
type: Class
subclass of: Optical Microscope
label: Lichtmikroskop @de
definition: An optical microscope that uses visible light to illuminate and magnify samples.
definition: Ein optisches Mikroskop, das sichtbares Licht verwendet, um Proben zu beleuchten und zu vergrößern. @de
definition source: ChatGPT 3.5

Light Microscopy
type: Class
subclass of: OpticalMicroscopy
label: Lichtmikroskopie @de
definition: Die Verwendung von sichtbarem Licht zur Beobachtung und Untersuchung kleiner Objekte oder Strukturen. @de
definition: The use of visible light to observe and study small objects or structures.
definition source: ChatGPT 3.5

Magnification
type: Class
subclass of: ValueObject
label: Vergrößerung @de
definition: Das Verhältnis zwischen der Größe eines von einem optischen System erzeugten Bildes und der Größe des Objekts. @de
definition: The process of enlarging the appearance of an image.
definition: The ratio of the size of an image produced by an optical system to the size of the object.
definition source: ChatGPT 3.5

Maximum Exposure
type: Class
subclass of: ValueObject
label: Maximale Belichtung @de
definition: The maximum duration for which the imaging sensor can be exposed to light, measured in seconds.
definition source: ChatGPT 3.5

Mechanical Polishing
type: Class
subclass of: ManufacturingProcess
label: Mechanisches Polieren @de
definition: Mechanical polishing is a material preparation technique used to enhance the surface quality and finish of a sample by removing thin layers of material through abrasion. It involves using abrasive materials, such as polishing cloths, diamond suspensions, or abrasive pastes, along with a polishing machine or device. The process typically includes several steps, each using progressively finer abrasives to achieve a smooth and mirror-like surface. During mechanical polishing, the sample is pressed against the rotating polishing medium with controlled pressure. The abrasive particles embedded in the medium gradually remove surface irregularities, scratches, and imperfections, resulting in improved flatness, clarity, and reflectivity. The process can be adjusted to target specific levels of surface roughness and precision. Mechanical polishing is commonly used in various scientific and industrial applications, such as metallography, materials science, electronics, and optics. It is an essential step before further analyses like microscopy, spectroscopy, or surface profiling, as it provides a pristine surface for accurate characterization and observation of material properties.
definition source: ChatGPT 3.5

Monochromatic Beam
type: Class
subclass of: Beam
label: Monochromatischer Strahl @de
definition: An electron beam consisting of electrons with a narrow range of energies, typically achieved using electron energy filters or monochromators.
definition: Ein Elektronenstrahl, der aus Elektronen mit einem engen Energiebereich besteht, der in der Regel durch Elektronenenergiefilter oder Monochromatoren erreicht wird. @de
definition source: ChatGPT 3.5

Monochromator
type: Class
subclass of: Optical Element
definition: An optical device that transmits a narrow range of wavelengths of light.
definition: Ein optisches Gerät, das einen engen Wellenlängenbereich von Licht überträgt. @de
definition source: ChatGPT 3.5

Objective Aperture
type: Class
subclass of: Aperture
label: Objektivblende @de
definition: An aperture in the objective lens system of a microscope.
definition: Eine Blende im Objektivlinsensystem eines Mikroskops. @de
definition source: ChatGPT 3.5

Objective Lens
type: Class
subclass of: Lens
label: Objektivlinse @de
definition: A lens in a microscope or similar optical device that is closest to the specimen.
definition: Eine Linse in einem Mikroskop oder ähnlichen optischen Gerät, die am nächsten zur Probe liegt. @de
definition source: ChatGPT 3.5

Optical Element
type: Class
subclass of: ProcessingNode
IAO_0000117: PMDco Team
IAO_0000119: ChatGPT 3.5
label: Optisches Element @de
definition: An Optical Element is a component of an optical system that affects the propagation of light, such as lenses, mirrors, or prisms.
definition: Ein optisches Element ist eine Komponente eines optischen Systems, das die Ausbreitung von Licht beeinflusst, wie Linsen, Spiegel oder Prismen. @de

Optical Microscope
type: Class
subclass of: Micropscope
label: Optisches Mikroskop @de
definition: A microscope that uses visible light and lenses to magnify specimens.
definition: Ein Mikroskop, das sichtbares Licht und Linsen zur Vergrößerung von Proben verwendet. @de
definition source: ChatGPT 3.5

Orientation Imaging Microscopy
type: Class
subclass of: Scanning Electron Microscopy
label: Bildgebende Orientierungsmikroskopie @de
definition: Orientation Imaging Microscopy is a microscopy technique used to map the crystallographic orientations of grains within a material. It is commonly applied in SEM to study the microstructural properties of polycrystalline materials.
definition source: ChatGPT 3.5
abbreviation: OIM

Palette
type: Class
subclass of: ValueObject
alternative label: Color Lookup Table
alternative label: Farbzuordnungstabelle @de
definition: In computer graphics, a palette is the set of available colors from which an image can be made. In some systems, the palette is fixed by the hardware design, and in others it is dynamic, typically implemented via a color lookup table (CLUT), a correspondence table in which selected colors from a certain color space's color reproduction range are assigned an index, by which they can be referenced.
example: Typical colorscales may be, e.g., greyscale, RGB, or CMYK.
definition source: https://en.wikipedia.org/wiki/Palette_(computing)
abbreviation: CLUT

Physical Process
type: Class
subclass of: Process
label: Physikalischer Prozess @de
definition: A physical process refers to a sequence of events or interactions that occur in the physical world and can be described and analyzed based on the principles of physics. These processes involve the transformation of energy, matter, or both, and they often follow established laws and theories of physics. In particular, a physical process may just occur due to natural circumstances and does not necessarily have to be induced by human activities or interactions.
definition source: ChatGPT 3.5

Pixel Size
type: Class
subclass of: ValueObject
label: Pixelgröße
definition: Die Größe der einzelnen Pixel in einem digitalen Bild oder einer Anzeige. @de
definition: The size of individual pixels in a digital image or display.
definition source: ChatGPT 3.5

Polarized Light Microscope
type: Class
subclass of: Light Microscope
label: Polarisiertes Lichtmikroskop @de
definition: A microscope that uses polarized light to observe and analyze samples.
definition: Ein Mikroskop, das polarisiertes Licht zur Beobachtung und Analyse von Proben verwendet. @de
definition source: ChatGPT 3.5
abbreviation: PLM

Polarized Light Microscopy
type: Class
subclass of: Light Microscopy
label: Polarisationslichtmikroskopie @de
definition: Polarized Light Microscopy is a technique that uses polarized light to enhance the contrast and reveal structural information in transparent samples. Light waves vibrate in specific directions, and by using polarizers to control the orientation of light waves, polarized light microscopy can highlight birefringent materials, anisotropic structures, and stress patterns within samples. This technique is valuable for studying crystalline structures, fibers, and anisotropic materials.
definition source: ChatGPT 3.5
abbreviation: PLM

Pole Piece
type: Class
subclass of: Optical Element
label: Polschuh @de
definition: A component of the electron column in an electron microscope that focuses and guides the electron beam onto the specimen.
definition: Eine Komponente der Elektronensäule in einem Elektronenmikroskop, die den Elektronenstrahl fokussiert und auf die Probe lenkt. @de
definition source: ChatGPT 3.5

Precession Electron Diffraction
type: Class
subclass of: Electron Diffraction
IAO_0000117: PMDco Team
IAO_0000119: ChatGPT 3.5
label: Präzessionselektronenbeugung @de
definition: Precession Electron Diffraction is a technique used in electron microscopy where the electron beam is tilted in a precession motion, improving the quality of diffraction patterns and reducing dynamical effects.
definition: Präzessionselektronenbeugung ist eine Technik in der Elektronenmikroskopie, bei der der Elektronenstrahl in einer Präzessionsbewegung geneigt wird, wodurch die Qualität der Beugungsmuster verbessert und dynamische Effekte reduziert werden. @de

Pressure
type: Class
subclass of: ValueObject
label: Druck @de
definition: Die auf eine Fläche ausgeübte Kraft in einem System, typischerweise gemessen in Pascal oder anderen Einheiten. @de
definition: The force exerted per unit area in a system, typically measured in pascals or other units.
definition source: ChatGPT 3.5

Primary Beam
type: Class
subclass of: Beam
label: Primärstrahl @de
definition: Der Hauptelektronenstrahl, der von der Elektronenquelle ausgesandt und auf die Probe in einem Elektronenmikroskop gerichtet wird. @de
definition: The main electron beam emitted from the electron source and directed towards the specimen in an electron microscope.
definition source: ChatGPT 3.5

Probe Current
type: Class
subclass of: Current
comment: The current in the probe is typically measured in nanoamperes (nA).
label: Sondenstrom @de
definition: Der Strom der Elektronen im fokussierten Elektronenstrahl, der zur Abbildung oder Analyse in einem Elektronenmikroskop verwendet wird. @de
definition: The current of electrons in the focused electron beam used for imaging or analysis in an electron microscope.
definition source: ChatGPT 3.5

Probe Size
type: Class
subclass of: ValueObject
label: Sensorgröße @de
label: Sondengröße @de
alternative label: Messfühlergröße @de
definition: Die Größe der Sonde oder des Strahls, die bei Mikroskopie- oder Spektroskopieverfahren verwendet werden. @de
definition: The size of the probe or beam used in microscopy or spectroscopy techniques. It is typically measured in nanometers (nm).
definition source: ChatGPT 3.5

Projector Lens
type: Class
subclass of: Lens
label: Projektorlinse @de
definition: A lens used to project the image from the intermediate lens onto a viewing screen or detector.
definition: Eine Linse, die verwendet wird, um das Bild von der Zwischenlinse auf einen Bildschirm oder Detektor zu projizieren. @de
definition source: ChatGPT 3.5

Readout Time
type: Class
subclass of: Time
label: Auslesezeit @de
definition: The time taken to read out data from a sensor, typically measured in nanoseconds (ns).
definition source: ChatGPT 3.5

Reconstruction
type: Class
subclass of: AnalysingProcess
label: Rekonstruktion @de
definition: Der Prozess der Erstellung eines dreidimensionalen Bildes oder Modells aus zweidimensionalen Daten. @de
definition: The process of creating a three-dimensional image or model from two-dimensional data.
definition source: ChatGPT 3.5

Resolution
type: Class
subclass of: ValueObject
label: Auflösung @de
definition: In various contexts, resolution refers to the degree of detail that can be discerned in an image, measurement, or other representation of an object or phenomenon.
definition: In verschiedenen Zusammenhängen bezieht sich die Auflösung auf den Grad der Detailgenauigkeit, die in einem Bild, einer Messung oder einer anderen Darstellung eines Objekts oder Phänomens erkennbar ist. @de
definition source: ChatGPT 3.5

Rotation Angle
type: Class
subclass of: Angle
label: Rotationswinkel @de
definition: Der Winkel, um den ein Objekt um eine bestimmte Achse rotiert wird. @de
definition: The angle by which an object is rotated around a specific axis.
definition source: ChatGPT 3.5

Scan Rate
type: Class
subclass of: TestingRate
label: Abtastrate @de
definition: Die Geschwindigkeit, mit der Daten gescannt oder aufgezeichnet werden. @de
definition: The speed at which data is scanned or recorded.
definition source: ChatGPT 3.5

Scanning Electron Microscope
type: Class
subclass of: ElectronMicroscope
label: Rasterelektronenmikroskop @de
definition: A microscope that produces images of a sample by scanning it with a focused beam of electrons.
definition: Ein Mikroskop, das Bilder einer Probe erzeugt, indem es diese mit einem fokussierten Elektronenstrahl abtastet. @de
definition source: ChatGPT 3.5
abbreviation: REM @de
abbreviation: SEM

Scanning Electron Microscopy
type: Class
subclass of: ElectronMicroscopy
label: Rasterelektronenmikroskopie @de
definition: Scanning Electron Microscopy is a microscopy technique that uses a focused beam of electrons to scan the surface of a sample. The interaction of the electrons with the sample generates signals that provide information about the sample's topography, morphology, and composition.
definition source: ChatGPT 3.5
abbreviation: SEM

Scanning Probe Microscope
type: Class
subclass of: ElectronMicroscope
label: Rastersondenmikroskop @de
definition: A type of microscope that images surfaces by scanning a probe over the sample.
definition: Ein Mikroskoptyp, der Oberflächen abbildet, indem er eine Sonde über die Probe führt. @de
definition source: ChatGPT 3.5

Scanning Probe Microscopy
type: Class
subclass of: ElectronMicroscopy
label: Rastersondenmikroskopie @de
definition: Scanning Probe Microscopy encompasses various techniques, such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM), that use a sharp probe to scan a sample's surface. These techniques provide high-resolution images and information about surface properties on the nanometer scale.
definition source: ChatGPT 3.5
abbreviation: SPM

Scanning Transmission Electron Microscope
type: Class
subclass of: Transmission Electron Microscope
label: Rastertransmissionselektronenmikroskop @de
definition: A type of transmission electron microscope where a focused electron beam is scanned across the sample.
definition: Eine Art von Transmissionselektronenmikroskop, bei dem ein fokussierter Elektronenstrahl über die Probe gescannt wird. @de
definition source: ChatGPT 3.5
abbreviation: STEM

Scanning Transmission Electron Microscopy
type: Class
subclass of: TransmissionElectronMicroscopy
label: Rastertransmissionselektronenmikroskopie @de
definition: Scanning Transmission Electron Microscopy is a technique that combines the principles of scanning and transmission electron microscopy. It allows imaging and spectroscopy with high spatial resolution.
definition source: ChatGPT 3.5
abbreviation: STEM

Scanning Transmission Electron Microscopy Electron Energy Loss Spectroscopy
type: Class
subclass of: Scanning Transmission Electron Microscopy
label: Rastertransmissionselektronenmikroskopie Elektronen-Energieverlust-Spektroskopie @de
definition: STEM-EELS combines STEM imaging with electron energy loss spectroscopy to provide information about the elemental composition and electronic structure of a sample at high spatial resolution.
definition source: ChatGPT 3.5
abbreviation: STEM-EELS

Scanning Tunneling Microscope
type: Class
subclass of: Scanning Probe Microscope
label: Rastertunnelmikroskop @de
definition: A microscope that uses quantum tunneling to image surfaces at the atomic level.
definition: Ein Mikroskop, das Quanten-Tunneling nutzt, um Oberflächen auf atomarer Ebene abzubilden. @de
definition source: ChatGPT 3.5
abbreviation: STM

Scanning Tunneling Microscopy
type: Class
subclass of: Scanning Probe Microscopy
label: Rastertunnelmikroskopie @de
definition: Scanning Tunneling Microscopy is a technique that uses a conducting probe to measure the tunneling current between the probe and the sample's surface. It provides atomic-scale images of surfaces and is often used to study conductive materials.
definition source: ChatGPT 3.5
abbreviation: STM

Schottky Emission Gun
type: Class
subclass of: Gun
IAO_0000117: PMDco Team
IAO_0000119: ChatGPT 3.5
label: Schottky-Emissionsquelle @de
definition: A Schottky Emission Gun is a device in electron microscopes that produces electrons by field-induced thermionic emission, using a Schottky emitter.
definition: Eine Schottky-Emissionsquelle ist ein Gerät in Elektronenmikroskopen, das durch feldinduzierte thermionische Emission Elektronen erzeugt und einen Schottky-Emitter verwendet. @de

Scintillator
type: Class
subclass of: Detector
label: Szintillator @de
definition: A material that emits light when it absorbs ionizing radiation.
definition: Ein Material, das Licht aussendet, wenn es ionisierende Strahlung absorbiert. @de
definition source: ChatGPT 3.5

Secondary Ion Mass Spectrometry
type: Class
subclass of: Spectroscopy
label: Sekundärionen-Massenspektrometrie @de
definition: Secondary Ion Mass Spectrometry (SIMS) is an advanced analytical technique used to determine the elemental and isotopic composition of solid surfaces and thin films at a very high sensitivity and spatial resolution. It is widely employed in various scientific and industrial applications, including materials science, semiconductor research, and surface analysis. In SIMS, a focused beam of high-energy primary ions is directed at a sample's surface. The impact of these primary ions causes the ejection of secondary ions from the sample's surface. These secondary ions are then extracted, mass-separated, and detected using a mass spectrometer. The mass spectrometer measures the mass-to-charge ratios of the secondary ions, providing information about the elemental and isotopic composition of the sample. The sensitivity and spatial resolution of SIMS allow researchers to analyze very small areas, often down to the micrometer or nanometer scale. This makes SIMS particularly valuable for investigating surface composition, depth profiling of layered structures, and detecting trace elements in complex materials. The technique is non-destructive in its elemental analysis, which is beneficial for studying delicate samples or preserving valuable materials. SIMS has applications in diverse fields, including materials characterization, semiconductor device analysis, biological and medical research, and geological studies. It provides essential information about the chemical composition, structure, and distribution of elements in complex samples, contributing to advancements in materials science and various technological developments.
definition source: ChatGPT 3.5
abbreviation: SIMS

Selected Area Electron Diffraction
type: Class
subclass of: Electron Diffraction
label: Elektronenbeugung ausgewählter Regionen @de
definition: Selected Area Electron Diffraction is a technique used in transmission electron microscopy (TEM) to study the crystallographic orientation of small regions within a sample. By selecting a specific area of the sample and directing an electron beam onto it, diffraction patterns are generated. These patterns offer insights into the sample's crystal structure and orientation.
definition source: ChatGPT 3.5
abbreviation: SAD
abbreviation: SAED

Sharpness
type: Class
subclass of: ValueObject
label: Schärfe @de
definition: Die Qualität, klar und gut definiert in einem Bild oder einer Probe zu sein. @de
definition: The quality of being clear and well-defined in an image or specimen.
definition source: ChatGPT 3.5

Silicon Drift Detector
type: Class
subclass of: Detector
label: Silizium-Driftdetektor @de
definition: A type of X-ray detector that offers high-speed performance and high energy resolution.
definition: Eine Art Röntgendetektor, der Hochgeschwindigkeitsleistung und hohe Energieauflösung bietet. @de
definition source: ChatGPT 3.5
abbreviation: SDD

Soft X-ray Emission Spectrometer
type: Class
subclass of: Spectrometer
label: Röntgenemissionsspektrometer mit weicher Röntgenstrahlung @de
definition: An instrument used to analyze the emission of soft X-rays from a sample.
definition: Ein Instrument zur Analyse der Emission weicher Röntgenstrahlen aus einer Probe. @de
definition source: ChatGPT 3.5
abbreviation: SXES

Source
type: Class
subclass of: ProcessingNode
label: Quelle @de
definition: Die Elektronenquelle, z. B. ein Wolframfaden oder eine Feldemissionskathode, die in einem Elektronenmikroskop Elektronen emittiert. @de
definition: The electron source, such as a tungsten filament or field-emission cathode, that emits electrons in an electron microscope.
definition source: ChatGPT 3.5

Spatial Resolution
type: Class
subclass of: Resolution
label: Ortsauflösung @de
definition: Die Fähigkeit eines Bildgebungssystems, feine Details in einem Objekt anzuzeigen. Sie bezieht sich auf das kleinste wahrnehmbare Detail in einem Bild. @de
definition: The ability of an imaging system to discern fine details in an object. It refers to the smallest discernible detail in an image.
definition source: ChatGPT 3.5

Spectrometer
type: Class
subclass of: Detector
label: Spektrometer @de
definition: An instrument used to measure properties of light over a specific portion of the electromagnetic spectrum.
definition: Ein Instrument zur Messung der Eigenschaften von Licht in einem bestimmten Teil des elektromagnetischen Spektrums. @de
definition source: ChatGPT 3.5

Spectroscopy
type: Class
subclass of: AnalysingProcess
alternative label: Spectrometry
alternative label: Spektrometrie @de
definition: Spectroscopy is a scientific technique used to study and analyze the interaction of matter with electromagnetic radiation, such as light. It involves measuring the way in which different substances absorb, emit, or scatter light at various wavelengths or frequencies. By examining the spectrum of light emitted, absorbed, or transmitted by a sample, scientists can gain insights into its chemical composition, molecular structure, and physical properties. Spectroscopy is widely utilized in various fields, including chemistry, physics, astronomy, and biochemistry, to investigate the characteristics and behavior of materials at the atomic and molecular level.
preferred label: Spektroskopie @de
definition source: ChatGPT 3.5

Spherical Aberration
type: Class
subclass of: Aberration
label: Sphärische Aberration @de
definition: A type of optical aberration caused by deviations from the ideal spherical shape in lenses or mirrors.
definition: Eine Art von optischer Aberration, die durch Abweichungen von der idealen sphärischen Form in Linsen oder Spiegeln verursacht wird. @de
definition source: ChatGPT 3.5

Spot
type: Class
subclass of: Object
label: Strahlfleck @de
definition: Spot refers to the focused point of the electron beam in an electron microscope, where the beam interacts with the specimen.
definition: Strahlfleck bezieht sich auf den fokussierten Punkt des Elektronenstrahls in einem Elektronenmikroskop, an dem der Strahl mit der Probe interagiert. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Spot Size
type: Class
subclass of: ValueObject
label: Spotgröße @de
label: Strahlfleckgröße @de
definition: Spot Size refers to the diameter of the electron beam at the point where it is focused on the specimen in an electron microscope.
definition: Strahlfleckgröße bezieht sich auf den Durchmesser des Elektronenstrahls an dem Punkt, an dem er auf die Probe fokussiert wird. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Stage
type: Class
subclass of: Component
label: Bühne @de
definition: A platform or support used to hold and position a specimen in a microscope.
definition: Eine Plattform oder Unterstützung, die verwendet wird, um eine Probe in einem Mikroskop zu halten und zu positionieren. @de
definition source: ChatGPT 3.5

Stigmation X
type: Class
subclass of: ValueObject
alternative label: Stigmator X Value
alternative label: Stigmator X Wert @de
definition: Die Einstellung des Astigmatismus in der X-Achse eines Elektronenstrahls in der Mikroskopie. @de
definition: The adjustment of astigmatism in the X-axis of an electron beam in microscopy.
definition source: ChatGPT 3.5

Stigmation Y
type: Class
subclass of: ValueObject
alternative label: Stigmator X Wert @de
alternative label: Stigmator Y Value
definition: Die Einstellung des Astigmatismus in der Y-Achse eines Elektronenstrahls in der Mikroskopie. @de
definition: The adjustment of astigmatism in the Y-axis of an electron beam in microscopy.
definition source: ChatGPT 3.5

Stigmator
type: Class
subclass of: ProcessingNode
definition: A device in electron microscopy used to correct astigmatism in the electron beam.
definition: Ein Gerät in der Elektronenmikroskopie zur Korrektur des Astigmatismus im Elektronenstrahl. @de
definition source: ChatGPT 3.5

Surface Structure
type: Class
subclass of: Object
label: Oberflächenstruktur @de
definition: Die Anordnung und die Merkmale der äußersten Schicht eines Materials. @de
definition: The arrangement and features of the outermost layer of a material.
definition source: ChatGPT 3.5

System Vacuum
type: Class
subclass of: Vacuum
label: Systemvakuum @de
definition: Das allgemeine Vakuumniveau im gesamten System eines Elektronenmikroskops. @de
definition: The overall vacuum level in the entire system of an electron microscope.
definition source: ChatGPT 3.5

Temporal Resolution
type: Class
subclass of: Resolution
IAO_0000117: PMDco Team
IAO_0000119: ChatGPT 3.5
label: Zeitliche Auflösung @de
definition: Temporal Resolution is the ability of a microscopy or imaging system to distinguish between events or changes occurring at different times, critical in capturing dynamic processes.
definition: Zeitliche Auflösung ist die Fähigkeit eines Mikroskopie- oder Bildgebungssystems, zwischen Ereignissen oder Änderungen zu unterscheiden, die zu unterschiedlichen Zeiten auftreten, was entscheidend für die Erfassung dynamischer Prozesse ist. @de

Thermionic Emission Gun
type: Class
subclass of: Gun
IAO_0000117: PMDco Team
IAO_0000119: ChatGPT 3.5
label: Thermionische Emissionsquelle @de
definition: A Thermionic Emission Gun is a device in electron microscopes that produces electrons by heating a filament to emit electrons through thermionic emission.
definition: Eine thermionische Emissionsquelle ist ein Gerät in Elektronenmikroskopen, das durch Erhitzen eines Filaments Elektronen durch thermionische Emission erzeugt. @de

Thin Foil Aperture
type: Class
subclass of: Aperture
label: Dünnfolienblende @de
definition: An aperture used in electron microscopy to control the electron beam passing through a thin foil specimen.
definition: Eine Blende in der Elektronenmikroskopie zur Steuerung des Elektronenstrahls, der durch eine Dünnfolienprobe geht. @de
definition source: ChatGPT 3.5

Threshold
type: Class
subclass of: ValueObject
label: Schwelle @de
definition: A value or limit at which a specific effect or result occurs.
definition: Ein Wert oder eine Grenze, bei der ein bestimmter Effekt oder ein Ergebnis eintritt. @de
definition source: ChatGPT 3.5

Tilt Angle
type: Class
subclass of: Angle
label: Neigungswinkel @de
definition: Der Winkel, um den ein Objekt von seiner vertikalen oder horizontalen Position geneigt ist. @de
definition: The angle at which an object is tilted from its vertical or horizontal position.
definition source: ChatGPT 3.5

Tilt Correction
type: Class
subclass of: AnalysingProcess
label: Neigungskorrektur @de
definition: A correction applied to images obtained from tilted specimens in electron microscopy to compensate for distortions caused by the tilt angle.
definition: Eine Korrektur, die bei Bildern von gekippten Proben in der Elektronenmikroskopie angewendet wird, um durch den Kippwinkel verursachte Verzerrungen zu kompensieren. @de
definition source: ChatGPT 3.5

Time Of Flight Secondary Ion Mass Spectrometry
type: Class
subclass of: Spectroscopy
label: Flugzeit-Sekundärionen-Massenspektrometrie @de
definition: Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is an advanced surface analysis technique used to determine the elemental and molecular composition of solid surfaces and thin films with high sensitivity and spatial resolution. It is employed in various scientific and industrial fields, including materials science, nanotechnology, biomedicine, and semiconductor research. TOF-SIMS builds upon the principles of Secondary Ion Mass Spectrometry (SIMS), where a focused beam of high-energy primary ions is directed at a sample's surface, causing the ejection of secondary ions. In TOF-SIMS, the flight time of these secondary ions is measured as they travel through a field-free region and enter a time-of-flight mass spectrometer. The mass spectrometer measures the time taken by the ions to reach the detector, which is directly proportional to their mass-to-charge ratio. By analyzing the flight times of the secondary ions, TOF-SIMS can determine the elemental, isotopic, and molecular composition of the sample's surface. It provides information about the presence of specific elements, chemical compounds, and molecular fragments, along with their spatial distribution. The high sensitivity of TOF-SIMS allows for the detection of trace elements and molecular species in complex samples. TOF-SIMS is valuable for characterizing surfaces at the nanoscale, profiling layered structures, investigating organic and inorganic materials, and studying biological specimens. Its ability to provide detailed chemical information while maintaining spatial resolution makes it an essential tool for understanding surface properties and material interactions in a wide range of applications.
definition source: ChatGPT 3.5
abbreviation: TOF-SIMS

Tomographic Reconstruction
type: Class
subclass of: Reconstruction
label: Tomographische Rekonstruktion @de
definition: Der Prozess der Rekonstruktion einer dreidimensionalen Struktur aus einer Reihe von zweidimensionalen Bildern, die aus verschiedenen Winkeln aufgenommen wurden. @de
definition: The process of reconstructing a three-dimensional structure from a series of two-dimensional images taken at different angles.
definition source: ChatGPT 3.5

Transmission Electron Aberration-corrected Microscope
type: Class
subclass of: Transmission Electron Microscope
label: Transmissionselektronen-Aberrations-korrigiertes Mikroskop @de
definition: A transmission electron microscope equipped with aberration correction to achieve high-resolution imaging.
definition: Ein Transmissions-Elektronenmikroskop mit Aberrationskorrektur zur Erzielung hochauflösender Bilder. @de
definition source: ChatGPT 3.5
abbreviation: TEAM

Transmission Electron Microscope
type: Class
subclass of: ElectronMicroscope
label: Transmissionelektronenmikroskop @de
definition: A microscope that transmits a beam of electrons through a specimen, forming an image.
definition: Ein Mikroskop, das einen Elektronenstrahl durch eine Probe sendet und ein Bild erzeugt. @de
definition source: ChatGPT 3.5
abbreviation: TEM

TransmissionElectronMicroscopy
type: Class
subclass of: ElectronMicroscopy
definition: Transmission Electron Microscopy is a microscopy technique that involves transmitting a beam of electrons through a thin sample to create high-resolution images. It is used to study the internal structure and morphology of materials at the nanometer scale.
definition source: ChatGPT 3.5
abbreviation: TEM

Vacuum
type: Class
subclass of: Object
label: Vakuum @de
definition: A space entirely devoid of matter, or where the pressure is significantly lower than atmospheric pressure.
definition: Ein Raum, der völlig materiefrei ist oder in dem der Druck deutlich unter dem atmosphärischen Druck liegt. @de
definition source: ChatGPT 3.5

Vacuum Pump
type: Class
subclass of: ProcessingNode
label: Vakuumpumpe @de
definition: A Vacuum Pump is a device used in electron microscopes to evacuate air from the chamber, creating the necessary vacuum conditions for electron beam operation.
definition: Eine Vakuumpumpe ist ein Gerät, das in Elektronenmikroskopen verwendet wird, um Luft aus der Kammer zu evakuieren und die notwendigen Vakuumbedingungen für den Betrieb des Elektronenstrahls zu schaffen. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Vertical Field Width
type: Class
subclass of: Field Width
label: Vertikale Feldbreite @de
definition: Vertical Field Width refers to the vertical extent of the observable field in an electron microscope.
definition: Vertikale Feldbreite bezieht sich auf den vertikalen Umfang des beobachtbaren Feldes in einem Elektronenmikroskop. @de
IAO_0000119: ChatGPT 3.5
IAO_0000117: PMDco Team

Voltage
type: Class
subclass of: ValueObject
comment: Die Spannung wird in Volt (V) gemessen und in Kilovolt (kV) repräsentiert und stellt die potenzielle Energiedifferenz zwischen zwei Punkten in einem Stromkreis dar. Je höher die Spannung ist, desto größer ist die Kraft, die die elektrischen Ladungen antreibt, und desto höher ist folglich auch das Potenzial für einen Stromfluss. @de
comment: Voltage is measured in volts (V) and typically represented in kilovolts (kV), and it represents the potential energy difference between two points in a circuit. The higher the voltage, the greater the force pushing the electric charges, and consequently, the higher the potential for current to flow.
label: Spannung @de
alternative label: Stromspannung @de
definition: Die Spannung, auch elektrische Potentialdifferenz, ist ein Maß für die elektrische potentielle Energie pro Ladungseinheit in einem elektrischen Stromkreis. Sie ist die Kraft, die den elektrischen Strom durch einen Leiter treibt. @de
definition: Voltage, also known as electric potential difference, is a measure of the electric potential energy per unit charge in an electrical circuit. It is the force or pressure that drives electric current through a conductor.
definition source: ChatGPT 3.5

Volume
type: Class
subclass of: ValueObject
label: Volumen @de
definition: Die Menge an Raum, die ein Stoff oder Gegenstand einnimmt. @de
definition: The amount of space that a substance or object occupies.
definition source: ChatGPT 3.5

Wait Time
type: Class
subclass of: Duration
comment: Die Wartezeit wird häufig genutzt, um die Probe zu stabilisieren oder um die Beschädigung der Probe zu minimieren. @de
comment: The wait time is often used to allow the specimen to stabilize or to minimize sample damage.
label: Wartezeit @de
definition: Das Zeitintervall zwischen aufeinander folgenden Messungen oder Operationen in einem Elektronenmikroskop. @de
definition: The time interval between successive measurements or operations in an electron microscope.
definition source: ChatGPT 3.5

Working Distance
type: Class
subclass of: Distance
comment: Der Arbeitsabstand wirkt sich auf die Tiefenschärfe und die Auflösung des Bildes aus. In der Regel wird der Arbeitsabstand in Millimetern (mm) angegeben. @de
comment: The working distance affects the depth of field and the resolution of the image. Usually, the working distance is specified in millimeters (mm).
label: Arbeitsabstand @de
definition: Der Abstand zwischen der Objektivlinse des Elektronenmikroskops und der Probenoberfläche, wenn der Elektronenstrahl auf die Probe fokussiert wird. @de
definition: The distance between the electron microscope objective lens and the specimen surface when the electron beam is focused on the specimen.
definition source: ChatGPT 3.5

X-ray Absorption Near Edge Spectroscopy
type: Class
subclass of: Spectroscopy
label: Röntgenabsorptionsspektroskopie im Nahbereich @de
definition: X-ray Absorption Near Edge Spectroscopy (XANES) is a specialized technique used in the field of materials science and spectroscopy to study the electronic and structural properties of materials. It focuses on the X-ray absorption spectra of atoms within a sample, particularly the region just above the absorption edge of an element's X-ray absorption spectrum. In XANES, a sample is irradiated with X-rays, typically generated by a synchrotron radiation source. These X-rays are tuned to specific energy levels corresponding to the absorption edges of the elements of interest in the sample. As the X-rays are absorbed by the sample, the energy levels of the atoms are altered, leading to various transitions in their electron configurations. The resulting X-ray absorption spectrum is measured, specifically targeting the energies just above the absorption edge. XANES provides information about the electronic structure of the atoms within the sample, including the oxidation state, chemical bonding, and local environment of the absorbing element. The fine details of the XANES spectrum offer insights into the atomic and molecular interactions, as well as the coordination and symmetry of atoms in different chemical environments. This technique is widely used in various scientific fields, including chemistry, solid-state physics, and materials science. XANES helps researchers understand the properties and behavior of materials at the atomic level, making it an invaluable tool for investigating the characteristics of complex materials, catalysts, minerals, and biomolecules.
definition source: ChatGPT 3.5
abbreviation: XANES

X-ray Absorption Spectroscopy
type: Class
subclass of: X-ray Mapping
label: Röntgenabsorptionsspektroskopie @de
definition: X-ray Absorption Spectroscopy is a technique used to study the electronic and local structural properties of materials by analyzing the absorption of X-rays. It involves measuring how X-rays are absorbed by a sample at various energies, providing insights into the electronic states and chemical environments of specific elements.
definition source: ChatGPT 3.5
abbreviation: XAS

X-ray Analysis
type: Class
subclass of: AnalysingProcess
label: Röntgenanalyse @de
definition: X-ray analysis is a technique used to investigate the composition and structure of materials by exposing them to X-rays. When X-rays interact with a material, they can be absorbed, scattered, or diffracted in ways that provide information about the material's internal arrangement of atoms and its elemental composition.
definition source: ChatGPT 3.5

X-ray Diffraction
type: Class
subclass of: Diffraction
alternative label: Röntgenstrahlbeugung @de
definition: X-ray Diffraction is a technique that utilizes the diffraction of X-rays by crystals to determine their atomic arrangement and lattice structure. X-ray diffraction patterns are produced when X-rays strike a crystalline sample, and the resulting pattern provides information about the arrangement of atoms in the crystal lattice.
preferred label: Röntgenbeugung @de
definition source: ChatGPT 3.5
abbreviation: XRD

X-ray Fluorescence
type: Class
subclass of: X-ray Mapping
label: Röntgenfluoreszenz @de
definition: X-ray Fluorescence is a method used to determine the elemental composition of a sample by analyzing the X-rays emitted when the sample is exposed to high-energy X-rays. The X-rays emitted are characteristic of the elements present, allowing for quantitative analysis of the sample's elemental composition.
definition source: ChatGPT 3.5
abbreviation: XRF

X-ray Mapping
type: Class
subclass of: X-ray Analysis
label: Röntgen-Mapping @de
definition: X-ray mapping is a process that involves generating spatially resolved images of the distribution of specific elements within a sample. By collecting X-ray signals emitted or scattered from a sample at different points, an elemental map can be created, showing the varying concentrations of elements across the sample's surface.
definition source: ChatGPT 3.5

X-ray Microanalysis
type: Class
subclass of: X-ray Analysis
label: Röntgen-Mikroanalyse @de
definition: X-ray Microanalysis is a technique that combines microscopy and X-ray analysis to study the elemental composition of small regions within a sample. It involves focusing an electron or X-ray beam on a specific area of the sample and measuring the X-rays emitted from that area to determine the elemental composition.
definition source: ChatGPT 3.5

X-ray Photoelectron Spectroscopy
type: Class
subclass of: X-ray Mapping
label: Röntgenphotoelektronenspektroskopie @de
definition: X-ray Photoelectron Spectroscopy, also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a technique used to study the surface chemistry of materials. XPS involves bombarding a sample's surface with X-rays to emit photoelectrons, which are then analyzed to determine the elemental composition and chemical states of the elements on the surface.
definition source: ChatGPT 3.5
abbreviation: XPS

X-ray Energy Dispersive Spectrometer
type: Class
equivalent class: Restriction
  on property: hasFunction
  some values from: Energy Filter
equivalent class: Restriction
  on property: hasFunction
  some values from: Image Filter
subclass of: Spectrometer
IAO_0000117: PMDco Team
IAO_0000119: ChatGPT 3.5
label: Röntgen-Energie-dispersiver Spektrometer @de
definition: An X-ray Energy Dispersive Spectrometer is a device used in electron microscopes to analyze the elemental composition of samples by detecting X-rays emitted from the sample.
definition: Ein Röntgen-Energie-dispersiver Spektrometer ist ein Gerät, das in Elektronenmikroskopen verwendet wird, um die Elementzusammensetzung von Proben durch Detektion der vom Probenmaterial emittierten Röntgenstrahlen zu analysieren. @de

3D Coordinates
type: Class
subclass of: Coordinates
label: 3D-Koordinaten @de
definition: Coordinates that specify a point in three-dimensional space.
definition: Koordinaten, die einen Punkt im dreidimensionalen Raum spezifizieren. @de
definition source: ChatGPT 3.5

Three dimensional reconstruction
type: Class
subclass of: Reconstruction
label: Dreidimensionale Rekonstruktion @de
definition: Der Prozess der Erstellung einer dreidimensionalen Darstellung eines Objekts oder einer Szene aus zweidimensionalen Bildern oder Daten. @de
definition: The process of creating a three-dimensional representation of an object or scene from two-dimensional images or data.
definition source: ChatGPT 3.5

3D X Coordinate
type: Class
subclass of: 3D Coordinates
label: 3D X-Koordinate @de
definition: Die X-Koordinate in einem dreidimensionalen Koordinatensystem. @de
definition: The X-coordinate in a three-dimensional coordinate system.
definition source: ChatGPT 3.5

3D Y Coordinate
type: Class
subclass of: 3D Coordinates
label: 3D Y-Koordinate @de
definition: Die Y-Koordinate in einem dreidimensionalen Koordinatensystem. @de
definition: The Y-coordinate in a three-dimensional coordinate system.
definition source: ChatGPT 3.5

3D Z Coordinate
type: Class
subclass of: 3D Coordinates
label: 3D Z-Koordinate @de
definition: Die Z-Koordinate in einem dreidimensionalen Koordinatensystem. @de
definition: The Z-coordinate in a three-dimensional coordinate system.
definition source: ChatGPT 3.5

4D Scanning Transmission Electron Microscopy
type: Class
subclass of: Scanning Transmission Electron Microscopy
label: 4D-Rastertransmissionselektronenmikroskopie @de
definition: 4D-STEM is a technique that adds an additional dimension of information, time, to STEM imaging, allowing the study of dynamic processes in materials at high spatial and temporal resolutions.
definition source: ChatGPT 3.5
abbreviation: 4D-STEM