# this file is part of refractiveindex.info database
# refractiveindex.info database is in the public domain
# copyright and related rights waived via CC0 1.0

REFERENCES: |
    C. Yim, M. O'Brien, N. McEvoy, S. Winters, I. Mirza, J. G. Lunney, G. S. Duesberg.
    Investigation of the optical properties of MoS<sub>2</sub> thin films using spectroscopic ellipsometry.
    <a href="https://doi.org/10.1063/1.4868108"><i>Appl. Phys. Let.</i> <b>104</b>, 103114 (2014)</a>
COMMENTS: |
    3.01 nm film synthesized by vapor phase sulfurization. ~290 nm thick SiO<sub>2</sub> substrate thermally grown on <100> oriented crystalline Si wafer.
CONDITIONS:
    film_thickness: 3.01e-9
    substrate: SiO2/Si
DATA:
  - type: tabulated n
    data: |
        0.382417 2.16040
        0.396592 2.51564
        0.416745 2.91656
        0.434018 3.27182
        0.459558 3.64550
        0.473278 3.60961
        0.492746 3.47388
        0.523764 3.10205
        0.548934 2.95726
        0.571265 2.96688
        0.591157 3.25823
        0.606431 3.56764
        0.628912 3.74081
        0.652291 3.70488
        0.728738 3.47881
        0.888102 3.37157
  - type: tabulated k
    data: |
        0.382127 1.89574
        0.400486 2.03104
        0.416791 1.99480
        0.433725 1.87283
        0.449618 1.65896
        0.467191 1.24305
        0.485216 0.961825
        0.507273 0.803095
        0.532553 0.840303
        0.549190 1.00590
        0.578202 1.34921
        0.593541 1.47189
        0.603760 1.41693
        0.622144 1.22126
        0.643379 0.964387
        0.674322 0.762708
        0.725091 0.653029
        0.887428 0.691040