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REFERENCES: |
    D. F. Edwards and E. Ochoa.
    Infrared Refractive Indexes of Silicon.
    <a href="https://doi.org/10.1364/AO.19.004130"><i>Appl. Opt.</i>, <b>19</b>, 4130-4131 (1980)</a>
COMMENTS: |
    26 °C, crystal orientation <111>; 3-4 Ω-cm, n-type (phosporous-dopped)
DATA:
  - type: formula 7
    wavelength_range: 2.4373 25
    coefficients: 3.41983 0.159906 -0.123109 1.26878E-6 -1.95104E-9