# this file is part of refractiveindex.info database
# refractiveindex.info database is in the public domain
# copyright and related rights waived via CC0 1.0
REFERENCES: |
M. R. Vogt. Development of physical models for the simulation of optical properties of solar cell modules, PhD. Thesis (2015)
COMMENTS: |
85 nm thick silicon-nitride (SiN) film on a polished Si wafer. n = 2.13 @ 633 nm. Room temperature.
DATA:
- type: tabulated nk
data: |
0.25 2.515 3.50E-01
0.26 2.51 3.05E-01
0.27 2.497 2.62E-01
0.28 2.479 2.23E-01
0.29 2.458 1.90E-01
0.3 2.437 1.62E-01
0.31 2.416 1.38E-01
0.32 2.395 1.18E-01
0.33 2.376 1.01E-01
0.34 2.358 8.71E-02
0.35 2.34 7.49E-02
0.36 2.324 6.44E-02
0.37 2.31 5.54E-02
0.38 2.296 4.76E-02
0.39 2.283 4.09E-02
0.4 2.271 3.50E-02
0.41 2.26 2.99E-02
0.42 2.249 2.55E-02
0.43 2.239 2.16E-02
0.44 2.23 1.82E-02
0.45 2.222 1.52E-02
0.46 2.214 1.27E-02
0.47 2.206 1.04E-02
0.48 2.199 8.45E-03
0.49 2.193 6.76E-03
0.5 2.186 5.31E-03
0.51 2.181 4.08E-03
0.52 2.175 3.04E-03
0.53 2.17 2.18E-03
0.54 2.165 1.48E-03
0.55 2.16 9.34E-04
0.56 2.156 5.22E-04
0.57 2.152 2.35E-04
0.58 2.148 6.43E-05
0.59 2.145 1.06E-06
0.6 2.141 0.00E+00
0.61 2.138 0.00E+00
0.62 2.136 0.00E+00
0.63 2.133 0.00E+00
0.64 2.131 0.00E+00
0.65 2.128 0.00E+00
0.66 2.126 0.00E+00
0.67 2.124 0.00E+00
0.68 2.122 0.00E+00
0.69 2.12 0.00E+00
0.7 2.118 0.00E+00
0.71 2.117 0.00E+00
0.72 2.115 0.00E+00
0.73 2.114 0.00E+00
0.74 2.112 0.00E+00
0.75 2.111 0.00E+00
0.76 2.109 0.00E+00
0.77 2.108 0.00E+00
0.78 2.107 0.00E+00
0.79 2.106 0.00E+00
0.8 2.105 0.00E+00
0.81 2.104 0.00E+00
0.82 2.103 0.00E+00
0.83 2.102 0.00E+00
0.84 2.101 0.00E+00
0.85 2.1 0.00E+00
0.86 2.099 0.00E+00
0.87 2.098 0.00E+00
0.88 2.097 0.00E+00
0.89 2.097 0.00E+00
0.9 2.096 0.00E+00
0.91 2.095 0.00E+00
0.92 2.094 0.00E+00
0.93 2.094 0.00E+00
0.94 2.093 0.00E+00
0.95 2.092 0.00E+00
0.96 2.092 0.00E+00
0.97 2.091 0.00E+00
0.98 2.091 0.00E+00
0.99 2.09 0.00E+00
1 2.09 0.00E+00
1.01 2.089 0.00E+00
1.02 2.089 0.00E+00
1.03 2.088 0.00E+00
1.04 2.088 0.00E+00
1.05 2.087 0.00E+00
1.06 2.087 0.00E+00
1.07 2.086 0.00E+00
1.08 2.086 0.00E+00
1.09 2.085 0.00E+00
1.1 2.085 0.00E+00
1.11 2.085 0.00E+00
1.12 2.084 0.00E+00
1.13 2.084 0.00E+00
1.14 2.084 0.00E+00
1.15 2.083 0.00E+00
1.16 2.083 0.00E+00
1.17 2.083 0.00E+00
1.18 2.082 0.00E+00
1.19 2.082 0.00E+00
1.2 2.082 0.00E+00
1.21 2.081 0.00E+00
1.22 2.081 0.00E+00
1.23 2.081 0.00E+00
1.24 2.08 0.00E+00
1.25 2.08 0.00E+00
1.26 2.08 0.00E+00
1.27 2.08 0.00E+00
1.28 2.079 0.00E+00
1.29 2.079 0.00E+00
1.3 2.079 0.00E+00
1.31 2.079 0.00E+00
1.32 2.079 0.00E+00
1.33 2.078 0.00E+00
1.34 2.078 0.00E+00
1.35 2.078 0.00E+00
1.36 2.078 0.00E+00
1.37 2.078 0.00E+00
1.38 2.077 0.00E+00
1.39 2.077 0.00E+00
1.4 2.077 0.00E+00
1.41 2.077 0.00E+00
1.42 2.077 0.00E+00
1.43 2.076 0.00E+00
1.44 2.076 0.00E+00
1.45 2.076 0.00E+00
1.46 2.076 0.00E+00
1.47 2.076 0.00E+00
1.48 2.076 0.00E+00
1.49 2.075 0.00E+00
1.5 2.075 0.00E+00
1.51 2.075 0.00E+00
1.52 2.075 0.00E+00
1.53 2.075 0.00E+00
1.54 2.075 0.00E+00
1.55 2.075 0.00E+00
1.56 2.074 0.00E+00
1.57 2.074 0.00E+00
1.58 2.074 0.00E+00
1.59 2.074 0.00E+00
1.6 2.074 0.00E+00
1.61 2.074 0.00E+00
1.62 2.074 0.00E+00
1.63 2.074 0.00E+00
1.64 2.073 0.00E+00
1.65 2.073 0.00E+00
1.66 2.073 0.00E+00
1.67 2.073 0.00E+00
1.68 2.073 0.00E+00
1.69 2.073 0.00E+00
1.7 2.073 0.00E+00
CONDITIONS:
film_thickness: 85e-9
substrate: Si