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REFERENCES: |
    M. Wöhlecke, V. Marrello, A. Onton.
    Refractive index of BaTiO<sub>3</sub> and SrTiO<sub>3</sub> films.
    <a href="https://doi.org/10.1063/1.323822"><i>J. Appl. Phys.</i> <b>48</b>, 1748–1750 (1977)</a>
COMMENTS: |
    Microcrystalline 1–4 µm thin film. Prepared by RF sputter deposition at 500 K substrate temperature.
DATA:
  - type: formula 1
    wavelength_range: 0.3 1.0
    coefficients: 0 2.9489 0.17712